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Representative low-cost semiconductor test systems

-- Test & Measurement World, 11/1/2002

Back to Affordable ATE: From lab to fab

Company Product Description Price
3MTS
San Jose, CA
408-435-1788
www.3mts.com 
3M20 LCRF   RF-capable configuration supports two 2.7-GHz RF port modules, each offering up to eight RF pins; ADC channels operate to 1 Gsample/s; up to 16 of digital I/O channels operate to 20 MHz.   From $200,000  
Agilent Technologies
Santa Clara, CA
800-452-4844
www.agilent.com
 
93000 C200e   Entry-level model in scalable 93000 series of systems is water-cooled, accommodates more that 1000 pins.   $560,000 (typical)  
Credence Systems
Fremont, CA
510-657-7400
www.credence.com
ASL 3000RF Mixed-signal RFIC test system incorporates vendor's modulated vector network analysis and features four parallel RF receivers; it accommodates up to eight RF ports at 6 GHz and up to 64 50-MHz digital pins.  

From $400,000

 

Eagle Test Systems
Mundelein, IL
847-367-8282
www.eagletest.com

ETS Series      ETS 600 simultaneously supports up to 128/256 digital channels, more than 400 analog channels, and 32 RF ports. ETS 200 simultaneously supports 80 analog channels and 16 digital channels.        From $89,000
IMS division of Credence
Fremont, CA
510-657-7400
www.credence.com  
Gemini MS Engineering validation test system for mixed-signal device debug, characterization, and failure analysis offers 336 I/O digital pins at data rates to 330 Mbytes/s, 96 pins of analog I/O operating from DC to 2.4 GHz, and 16 independent device power supplies; additional clock channels can provide eight clocks at up to 330 MHz.   From $495,000  
Inovys
Pleasanton, CA
925-924-9110
www.inovys.com
 
Ocelot 1536-pin production floor version and 256-pin desktop version focus on DFT test, provide 50 MHz scan data.   From $300,000 for production- floor version and $50,000 for desktop model  
Intellitech
Durham, NH
603-868-7116
www.intellitech.com  
RCT II   Desktop DFT silicon-debug system lets engineers construct a snapshot of IC operation near the time of the failure from repeated scan-chain dumps, permitting isolation of problems to the gate or RTL level.   $35,000 to 50,000  
LogicVision
San Jose, CA
408-453-0146
www.logicvision.com  
Validator For debug of silicon based on vendor’s embedded-test technology, desktop box has as many as four clocks operating to 330 MHz and includes two or four power supplies operating over 0- to 8-V or 0- to 20-V ranges; it employs an IEEE 1149.1 debug interface to a device under test.   $150,000  
LTX
Westwood, MA
781-461-1000
www.ltx.com
 
Fusion CX   Low-cost entry in vendor’s scalable Fusion family supports up to 128 digital pins at 66 MHz; it provides 64 V/I source/measurement channels, up to 16 pulsed-power pins, and up to 16 7.5-GHz RF ports.   From $250,000  
NPTest
San Jose, CA
408-586-8200
www.nptest.com
 
DeFT Single-bay DFT-focused tester shifts scan data at 200 MHz, offers less than 20-ps jitter, and can deliver up to 400 A.   From $1000 per pin in configurations to 320 pins  
SZ Testsysteme
Amerang, Germany
+49-8075-170
www.sz-testsysteme.de  
Piranha Analog and mixed-signal system supports up to 64 pins and accommodates the vendor’s 9-GHz RF Beacon subsystem.   From $150,000  
Teradyne
Boston, MA
617-482-2700
www.teradyne.com  
Integra FLEX   Supporting logic and memory design-for-test (DFT) techniques while also handling conventional functional test of analog and mixed-signal devices, this system incorporates an independent-instrument architecture.  Base price: $500,000  
Teseda
Portland, OR
503-223-3315
www.teseda.com 
Validator 500   Desktop engineering tester offers an Ethernet link to an external computer; works with vendor’s STIL-compliant DFT-Intelligent software, which imports test patterns as well as structural information about a chip’s DFT features.   $60,000
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