Bench & Modular Instruments on Test & Measurement World

Bench and Modular Instrumentation

Product news and application stories covering bench and modular instrumentation used in electronics testing.

Agilent offers HSPA+ test software
04/24/2008
Agilent's 89600 Series Vector Signal Analysis (VSA) software now offers HSPA+ analysis capability and works with Agilent's Signal Studio software for 3GPP W-CDMA to help R&D engineers troubleshoot PHY layer signal problems. More

Small-footprint scopes debug buses
05/08/2008
The Tektronix DPO3000 two- and four-channel 100-, 300-, and 500-MHz-bandwidth oscilloscopes incorporate Tek’s Wave Inspector technology, which facilitates searching through long waveform records for anomalous events. More
ZTEC rolls out 300-MHz PXI, PCI, and VXI oscilloscopes
05/07/2008
ZTEC's ZT4210 series of 300-MHz oscilloscopes comes in PXI, PCI, and VXI versions providing the same triggering, math, and analysis functions commonly found in bench instruments and ZTEC's other M-class oscilloscopes. More
NI LabView works with Tektronix value-line scopes
05/07/2008
National Instruments announces support for new Tektronix value-line oscilloscopes in the latest version of its LabView SignalExpress Tektronix Edition. More
Dytran receives ISO 17025 certification from A2LA
05/06/2008
Dytran Instruments announces that it has received ISO/IEC 17025:2005 certification from the American Association for Laboratory Accreditation (A2LA). More
Tektronix generator has high-amplitude output stage
05/06/2008
The latest addition to Tektronix' AFG3000 series of arbitrary/function generators, the AFG3011 delivers signal amplitudes of up to 20 V pk-pk into 50-ohm loads, twice the amplitude provided by other family members. More
Lambda adds 16-A devices to POL DC/DC converter line
05/06/2008
Lambda expands its range of point-of-load (POL) DC/DC converters with the launch of the iAD series of 16-A non-isolated converters housed in single-in-line packages. More
Pintail announces expanded adaptive-test software
05/05/2008
The new SwifTest products offer users the ability to dynamically optimize test time and test coverage, improve device quality and reliability, and actively monitor and improve device yield during production testing at both wafer probe and final test. More
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News from the Web

Avago Technologies receives 2008 Global Optocouplers Company of the Year Award
Test equipment maker sees WiMAX, telematics coming to CEE
Source: www.eetimes.eu
Date: May 8, 2008
ORA Improves Modeling and Disign Options with the Release of LightTools 6.1
Source: www.led-professional.com
Date: May 8, 2008
Industry-News/Pressure-Transducers-for-tough-environments-from-Inertial-Aerosystems
Source: www.electronicspecifier.com
Date: May 8, 2008
Elma, DFT Microsystems Team on SerDes Test Modules for Embedded Systems
Source: edageek.com
Date: May 7, 2008

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