Test & Measurement World - March 1, 2005

In our September 2004 issue, we profiled the accomplishments of six outstanding test engineers from various industries, and we asked our readers to vote for the Test Engineer of the Year. Your choice? Anthony Levandowski. As part of his award, Anthony will designate an engineering school to receive a $20,000 education grant, courtesy of National Instruments, the award sponsor.

• Automotive and Aerospace Test Report
• Automotive Structural Test
• Crash sleds test automakers' interior designs
• Editor's Note
• Simulation testing: What is it good for?
• Environmental Testing
• ESS aids automotive test
• Standards
• Testing CANopen products
• Test Report
• Navy chooses display supplier
• Seica supplies tester to Turkish Army
• NASA evaluates x-ray system
• Airbus test suite
• Handheld vibration meter
• Calendar
• Acquisition workstation
• GM chooses LMS for noise testing
• TI unveils weight sensor for airbag deployment systems

• Communications Test Report
• Broadcast Standards
• Single instrument spans many technologies
• Digital video goes mobile
• Communications Bus
• Instrument Ethernet links get standardized
• Editor's Note
• How may we help?
• Test Report
• Psytechnics and NetTest address wireless voice quality
• Wireless Age acquires Mmwave Technologies
• Ixia to offer WPA test stations
• BROADNETS proceedings now available
• Spectrum analyzer
• Shield for wireless test
• VoIP tester
• ESPN STAR Sports adds Tek equipment
• Test instruments available to GSA
• Scalability test software

• Departments
• Editor's Note
• Engineering and marketing synergism
• News Briefs
• News briefs
• Show Highlights
• Show Highlights: Measurement Science Conference
• Test Voices
• Tight testing
• Viewpoint
• A broader vision for industry pioneer

• Features
• Failure Analysis
• Improving sensor reliability
• Fiber-Optics Test
• Bits battle noise
• Project Profile
• Picture perfect
• Semiconductor Test
• Reduced pin-count test
• Test Product of the Year
• Small foot, big screen
• Test of Time Award
• Tester per pin for systems on a chip

• Product Update
• Featured Products
• Switch system gets dense
• Scopes get logic option
• Harmonic attenuator module
• Portable scopes keep up with designs
• Eight-port serial PCI card
• Fixed-point design tools
• Web Exclusive Products
• High-voltage pulse generator
• Waterproof temperature recorder
• 12-bit digitizer card
• Solderability tester
• FTIR interferometer module
• DVI compliance test software
• High-temperature IR cameras
• VXI frequency synthesizers
• WiFi adapter kits
• PXI starter kit
• Near-IR windowed camera
• Beam profiler camera options
• High-power X-ray target
• Product code readers
• Miniature chassis-mount switchers
• Immersion coolers
• 200-kHz acquisition boards
• Upgraded electrical safety tester
• MMS application-enabler tester
• Sweep generator
• PCI-based video imaging system
• High-output audio alarm
• Green laser modules

• Tech Trends
• Machine Vision
• Optics deserve attention
• Semiconductor Test
• EDA tools address IC cost and yield

• Test Digest
• Data Acquisition
• Isolate or denigrate
• EMC Test
• Transitioning to a new European directive