Test & Measurement World - June 1, 2005

All a fabless semiconductor company needs to develop an ASIC are some workstations and EDA software, right? Not in the case of Legend Silicon, which is looking to put its ICs into the estimated 40 to 50 million digital TV sets or set-top boxes sold annually in China.

• Automotive and Aerospace Test Report
• Automation
• Used robots perform auto and aero tasks
• Editor's Note
• SAE collaborates
• News
• USAF selects Tek as scope supplier
• Guide lists CANopen products
• Tutorial covers noise and vibration control
• SAE revises crash-test standard for electric vehicles
• JDS Uniphase consolidates operations
• Simulation prepares race car for Le Mans
• Products
• Dynamometer tables
• High-energy impact tester
• Automotive test kit
• Pressure-sensing film
• SAE 2005 World Congress
• 100 years of automotive engineering
• Standards
• Consortium promotes control applications
• Test Report
• News announcements from SAE

• Departments
• Editor's Note
• Recognizing engineers
• News Briefs
• News Briefs
• Show Highlights
• Show Highlights
• Test Voices
• PC-based test anniversaries
• Viewpoint
• Opportunities in RF/network convergence

• Features
• Data Acquisition
• USB reaches mainstream status
• Project Profile
• Distributed data
• RF Test
• Video goes mobile
• Wafer Inspection
• Keep your eye on the metal bumps
• Web Special Report
• Engineering's indispensable tool

• PXI Test Report
• Communications Test
• PXI in optical test
• Design for Test
• PXI extends reach of boundary scan
• Editor's Note
• Take PXI to the next level
• Instrumentation
• PXI DMMs gain a digit
• News
• Picolight chooses PXIT products
• Collaboration produces PXI real-time simulation
• Pickering Interfaces adds Mexican distributor
• DAC boards get software upgrade
• Products
• 5.5-digit DMM
• Aeroflex offers new catalog
• Toolset for IEEE 1641
• PXI controllers
• Portable test system
• Portable chassis
• Universal time interval counters
• Data-acquisition tool for Linux
• Modular DSO family
• Optical data digitizers
• Switching matrix test tool
• CPU board with FPGA

• Product Update
• Featured Products
• Semiconductor device analyzer
• Serial-to-Ethernet adapter
• VXI Slot 0 controller
• DSP data-acquisition board
• Agilent Vee makes ties to NI
• On-wafer probing for semiconductor R&D
• FIR filter option
• Low-noise 16-bit ADC
• NAND-based flash ISP support
• 2-Mpixel CCD vision system
• USB-to-GPIB controller
• Memory tester debuts
• Signal-conditioning module
• DMM with software
• Digital I/O modules
• Web Exclusive Products
• Wireless device servers
• PCI analog-input card
• Portable strain-measurement system
• Power system simulator
• AdvancedTCA processor blade
• DSP data acquisition board
• PXI switch modules
• Mixed-signal ATE system
• PCI time interval counters
• Multiprotocol tester
• Single-board camera
• High-intensity sound pressure sensors

• Tech Trends
• Is FTTP a home run?
• Manufacturing Test
• Putting the pigeons in the right holes

• Test Digest
• Basic Measurements
• Reduce noise in low-current measurements
• Electromagnetic Compliance
• Vias reduce EMI in photonics ICs
• Instruments
• DMM digits depend on performance