Test & Measurement World - October 1, 2005

Developing an effective design and test strategy for an IC can be a daunting task. At Agere Systems, each product benefits from a particular design and test strategy, which involves identifying an appropriate ATE system as well as an optimal combination of design-for-test and built-in self-test technologies.

• Communications Test Report
• Editor's Note
• Prepare for VoIP
• Products
• Service monitor reaches 2.7 GHz
• 800-MHz generator debuts
• Test set supports VoIP
• Instrumentation bridges debut
• Peleton releases multi-wavelength laser
• RF Test
• UWB wireless implementations get boosts
• Wireless Communications Test
• Double-barreled WiFi test

• Departments
• Editor's Note
• Best in test: people and products
• News Briefs
• News Briefs
• Show Highlights
• Show Highlights
• Test Voices
• Logistics nightmares
• Viewpoint
• Relationships key to boundary-scan success

• Features
• Design for Test
• IEEE 1149 expands differentially
• Inspection
• X-ray systems sharpen images
• Project Profile
• Chamber verifies quiet designs

• Product Update
• Featured Products
• Multifunction DMMs
• 55-W enclosed switchers
• Sampling scope software
• Power-distribution units
• USB digital I/O module
• Measurement system operates up to 3 GHz
• Spring-connection terminal blocks
• Signal integrity analyzers
• Megohmmeter
• Tunable laser source
• Graphical programming software
• Serial pulse generator
• Temperature humidity meter
• Web Exclusive Products
• Dual-input thermometer
• PC/104 RS-485 module
• Portable chillers
• 16-bit acquisition boards
• Real-time x-ray services
• 55-W enclosed switchers
• Transmit-quality DACs
• 3-GHz programmable attenuators
• Beam profiler upgrade
• Active vibration isolation system
• PLL/synthesizer
• Magnifiers
• Spectrum-analyzer probe adapter
• 125-W open-frame switchers

• Tech Trends
• Bench-Level Test
• Choose your domain
• Manufacturing Test
• How much test is enough?

• Test Digest
• Book Review
• When you need current and voltage
• Machine Vision
• Testing direct part marks
• Webcast
• Overcoming noise in data-acquisition systems