Test & Measurement World - November 1, 2005
Features
Bringing home the data
Plantronics headsets are everywhere: in homes, offices, contact centers, and airplanes. They've traveled as far as the moon, and today they're roaming wherever their wireless-phone-chattering wearers care to go. But Plantronics test engineers themselves are striving for a less peripatetic life. To that end, they're bringing up to speed software that should minimize their need to travel to far-flung manufacturing facilities.
- Automotive and Aerospace Test Report
- Aerospace Test
- Structural test verifies radar dome
- Case Study
- Mini-subassembly borescope ensures integrity
- Editor's Note
- Advancing test interfaces
- News
- Aerospace firm reduces noise levels
- VTI delivers accelerometers to Korean automakers
- IPC and JEDEC to host "lead free" conference
- Products
- 6-GHz PXI RF test modules
- HALT/HASS controller option
- Sensor processing system
- EUI functional tester
- Up-time optimization services
- CAN/LIN validation software
- Bidirectional digital I/O card
- Test Data
- IEEE sets in motion dual ATML test standards
- Departments
- Editor's Note
- Needed: technology investment
- News Briefs
- News Briefs
- Show Highlights
- Show Highlights
- Test Voices
- Safety society continues to expand
- Viewpoint
- Find your way through the data maze
- Features
- ATE
- Beyond at-speed
- Cable Test
- Protecting the tester
- Communications Test
- VoIP complicates test
- Project Profile
- Sometimes, analog is better
- Machine-Vision and Inspection Test Report
- Avionics
- Keep 'em flyin'
- Economics
- Justifying inspection in a test strategy
- Editor's Note
- Heating up
- News
- Firms unveil scalable GigE vision products
- Dalsa receives major contract
- AIA reaches record membership
- Matrox supports PCI Express
- Court sides with Cognex
- Omron to establish base in Shanghai
- View acquires Micro-Metric
- Products
- Smart cameras
- Intelligent camera
- Infrared camera
- Image-processing board
- Sensor software
- Fluorescent light source
- Technology
- Machine vision looks good
- Product Update
- Featured Products
- Mentor expands DFM strategy with YieldAssist
- Digital storage scopes
- CompactPCI subsystem
- Sentaurus extends TCAD physical modeling
- PMC sports Camera Link interface, FPGA
- Bud expands enclosure line
- Boundary scan for analog
- DDS function generator
- Multifunction USB devices
- PC oscilloscope
- Temperature transmitter
- Lead-free supply offers undervoltage alarms
- Arendar adds data analysis and reporting
- DC/DC converters for ATE
- Industrial multimeter
- Scope decodes CAN bus symbols
- Power quality monitor
- Web Exclusive Products
- Five-axis scanning system
- Thermo-anemometer
- Rack-mount fan coolers
- ZigBee RF system-on-chip
- BNC-to-BNC adapter
- Industrial DIN-rail supplies
- Modular AC/DC switchers
- 0.4-mm spring probe
- Offset Kelvin probe
- Tech Trends
- Machine Vision
- Will CMOS sensors catch up?
- Semiconductor Test
- Bench instruments to the rescue for RFIC design and test
- Test Digest
- Free program helps you design filters
- Book Review
- Measuring 65-nm circuits
- Software
- Create your own data plots
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