Test & Measurement World - March 1, 2006

Test Engineer of the Year Zafer Boz has developed a text-based test executive, serves as a principal test systems engineer, and is earning a master's degree, all while adapting to a new culture.

• Communications Test Report
• Editor's Note
• Triple play or triple threat?
• Field Test
• VoIP test moves to the field
• Network Test
• DSL tests focus on copper
• News
• Alliance forms to promote Ethernet
• CETECOM Spain obtains PTCRB GERAN approval
• Firms collaborate on HSDPA RF tester
• Report examines market for Gigabit Ethernet test equipment
• Products
• RF vector signal generator
• Spectrum analyzer viewer application
• Transceiver development platform
• Wireless Communications
• Meeting the demands of Wi-Fi test

• Departments
• Editor's Note
• Is the science threat real?
• News Briefs
• News briefs
• Test Voices
• Mission: Improbable
• Viewpoint
• Identifying customers' unmet needs

• Features
• Compliance
• Lead makes an electronic exit
• Failure Analysis
• Probing flip-chip interfaces
• Project Profile
• Quick custom optical networks
• Test Product of the Year
• Optimizing resolution and sampling rate
• Test of Time Award
• It sources, it measures, it automates

• Product Update
• Featured Products
• Scroll through waveform samples
• Logic analyzers do vector signal analysis
• Analog generator delivers 3 GHz
• I2C bus analyzer/tester
• Bluetooth tester handles EDR and AFH
• 14-bit PCI digitizer
• Sensor makes laser measurements
• Thermal shock chamber needs little room

• Tech Trends
• Bench-Level Test
• Tall and shallow or short and deep?
• Manufacturing Test
• Material changes

• Test Digest
• Board Test
• Integrating boundary scan into ATE channel cards
• Book Review
• An EE course without the all-nighters
• Instruments
• Use Matlab in a scope's data stream