Test & Measurement World - May 1, 2006

A line-up of probe systems, emission microscopes, and other image-based tools helps engineers optimize processes and processors for IBM Microelectronics' 300-mm fab.

• Departments
• Editor's Note
• Time for D-Link to own up
• News Briefs
• News Briefs
• Show Highlights
• Show Highlights
• Test Voices
• Up in the air over cell-phone EMI
• Viewpoint
• A global reach for AOI technology

• Features
• Communications Test
• IPTV: Video's latest test frontier
• Machine Vision
• Ethernet vs. Camera Link
• Project Profile
• Roll a million miles

• Machine-Vision and Inspection Test Report
• Editor's Note
• A product for every taste
• Highlights
• Basler launches camera lines
• Agilent AOI system validates component placement
• Market study shows positive outlook
• Machine-Vision and Inspection Report
• Data Matrix codes demand proper lighting
• Thermal imaging maps device heat dissipation
• Agilent looks at inspection trends
• Products
• Three-chip camera eases system integration
• Library works with machine-vision software
• Software hones x-ray image inspection
• IR camera has broad spectral response

• Product Update
• Featured Products
• ScanFlex available for in-circuit testers
• Audio analyzer teams with programming applications
• Portable signal generator offers multiple options
• Temperature loggers record data on eight channels
• Probe holder remains stable despite high or low temperatures
• AC/DC supplies permit plug-and-play customization
• 8-bit PCI digitizer acquires 250 Msamples/s
• Service monitor features color display
• Chart recorder monitors up to 18 process sensors
• Mix and match modules in USB data-acquisition system
• A half rack of switch modules, please
• 1-kVA power source works with electrical safety analyzers
• Fixed-distance slot sensors available in six widths

• Tech Trends
• Bench-Level Test
• Here come the lawyers
• Manufacturing Test
• Electrons get faster

• Test Digest
• Book Review
• Getting the dope on nanotechnology
• Circuit Analysis
• Deriving Thevenin equivalents
• EMI Standard
• EMI standard planned for replaceable modules