Test & Measurement World - June 1, 2006

Many people say, "It's a digital world," but don't say that to engineers at Analog Devices. These engineers use a combination of manual and automated systems to test preproduction ICs that process analog signals in cell phones, base stations, and many other "digital" products.

• Automotive and Aerospace Test Report
• Automotive and Aerospace Test Report
• Cold Regions Test Center supports US troops
• Weighing cost vs tolerances
• Editor's Note
• Attend a PXI seminar
• Highlights
• Inalfa Roof Systems chooses Intertek accelerated tester
• NQA acquires California firm
• CAN product guide available
• IEEE approves testing standard for nanotubes
• Team uses NASA tunnel to test blended wing body
• Products
• DAQ hardware includes tachometer channel
• Module sports 16 RS-485 ports
• Oscilloscopes add CAN/LIN option
• Module combines CAN, GPS, and wireless modem
• Noise and vibration analyzer gains mobile front end

• Departments
• Editor's Note
• Patent common sense
• News Briefs
• News Briefs
• Show Highlights
• Show Highlights
• Test Voices
• The underlying test code
• Viewpoint
• A relentless drive for greater testing accuracy

• Features
• Design for Test
• Limits of test time reduction
• Inspection
• Post-test inspection boosts die yields
• Project Profile
• See the unseen: Testing a radar vision system

• PXI Test Report
• Editor's Note
• Innovation's one-two punch
• Highlights
• NI introduces PXI Express chassis and controllers
• Goepel looks to PXI Express
• PXI Report
• PXI Express set to speed PXI market
• PXI tackles processor benchmarks
• Riding the PXI wave
• Products
• Test system leverages PXI flexibility
• PXI chassis gains features
• 6-U module features 128-channel I/O
• aModule simulates batteries
• Signal generators output DC to 6.6 GHz

• Product Update
• Featured Products
• Power analyzer figures out fluctuations and flicker
• IDDQ current monitor adds on to ATE systems
• Keithley enters pulse generator market
• Analog-output devices employ USB interface
• Software performs WLAN roaming tests
• Sapera adds geometric search
• Signal conditioner interfaces with accelerometers
• Berkeley introduces portable power meter
• ProVision assists boundary-scan development
• GPIB card transfers data at 1.5-Mbytes/s
• LXI video switch matrix is software-configurable
• Connect to VXI over Ethernet
• AOI system boasts fast setup, small footprint
• PC/104 digital I/O module is field programmable

• Tech Trends
• Machine Vision
• Sensors simplify vision systems
• Semiconductor Test
• Integration paces point-tool development

• Test Digest
• Book Review
• A semiconductor test primer
• Communications Test
• The network is the test bed
• Semiconductor Test
• Test's role on the path to zero-defect devices