Test & Measurement World - November 1, 2007

At the Lowell headquarters of Tyco Electronics, a maker of RF components and subsystems used in defense and aerospace applications, engineers design antennas in many shapes and sizes that run at frequencies up to 60 GHz. Most of these antennas fit into aircraft, missiles, and munitions.

• Departments
• Editor's Note
• Test cocktail reaching its limit?
• News Briefs
• News Briefs
• Show Highlights
• MIL/aero venue showcases general-purpose instruments
• Test Voices
• Concentrated oxygen
• Viewpoint
• Breaking down barriers to machine vision

• Features
• Machine Vision
• Engineers warm up to IR vision
• Project Profile
• Keeping the videoconference moving
• RF/Microwave Test
• LXI speeds gigahertz measurements

• PXI Test Report
• Editor's Report
• What will drive PXI?
• Guest Commentary
• PXI enables high-channel-count, single-chassis data acquisition
• Highlights
• Highlights
• PXI Report
• PXI makes inroads into RF test
• Taking PXI to the next level
• Products
• Geotest releases PXI standards module
• National Instruments debuts PXI RF vector signal generator
• Pickering introduces 2-A PXI switch matrix
• Aeroflex PXI RF platform operates to 6 GHz

• Product Update
• Featured Products
• Mentor debuts TestKompress Xpress
• USB modules offer 80 analog inputs
• Signal generator features fast frequency changes
• Agilent announces TD-SCDMA calibration application
• Astro-Med’s portable recorder logs 32 channels
• Strategic Test releases 100-Msamples/s PCI Express oscilloscope card
• A team approach to network testing
• Aeroflex introduces synthetic instrument system
• B&K Precision releases DC supply for test and service
• Digitizer card streams in four lanes
• COMSOL 3.4 adds parallel processing and SPICE models

• Tech Trends
• Design, Test and Yield
• Tools take aim at memory yield
• Machine Vision
• Send vision data to SPC software

• Test Digest
• Book Review
• The tools and tricks of WLAN test
• Instruments
• Simulations and measurements show consistency
• Semiconductor Test
• Evolving IC technology influences impedance measurements