Test & Measurement World - December 1, 2007

Our editors have announced the winners of the 2008 Best in Test Awards. Read about the 12 winners, and then cast your vote for the Test Product of the Year.

• Departments
• Editor's Note
• Embedded instruments
• News Briefs
• News Briefs
• Show Highlights
• Production show highlights electronics inspection and test
• ITC innovations span RF hardware to test software
• Test Voices
• You can’t shrink heat
• Viewpoint
• Sensing the needs of test engineers

• Features
• Best In Test
• 2008 Best in Test Awards: Honorable Mentions
• Failure Analysis
• Engineering microscopes zoom in on defects
• Fiber-Optics Test
• Optical power measurements ensure quality bits
• Machine Vision
• FPGAs improve vision processing
• Project Profile
• Tests keep tracking shipments

• Machine-Vision and Inspection Test Report
• Editor's Note
• Embrace less common techniques
• Highlights
• Highlights
• Cameras, lights, frame grabbers, and optics debut at Vision 2007
• Machine-Vision and Inspection Report
• Infrared inspection finds unexpected hot spots
• GigE Vision and frame grabbers
• Products
• X-ray system recognizes submicron features
• Wafer-inspection system handles 45-nm lithography
• AXI system offers programmable angle-shot capability
• AOI system inspects PCB assemblies
• Inspection system employs interferometry
• 3-D metrology system boasts high precision

• Market Trends
• Instrumentation Buses
• The ATE industry's hybrid theory

• Product Update
• Featured Products
• Mathematica gains application add-ons
• PCIe digitizer simultaneously samples
• Test card analyzes PCI Express 2.0 traffic
• Vibration analyzer moves to Windows Mobile

• Tech Trends
• Design, Test and Yield
• SOC ATE gains RF instrumentation
• Instrumentation
• 100-Gbps Ethernet is coming

• Test Digest
• Instrument Programming
• Software wrapper links Matlab to instruments
• RF Test
• Demystifying production test of UWB devices
• Webcast
• Enterprise software supports test effort