Test & Measurement World - June 1, 2008

Nanometer semiconductor devices present significant validation, characterization, and analysis challenges as designs move from tape-out to high-volume production. To help chip makers get such devices to market quickly, Presto Engineering deploys a variety of test and analysis equipment and expertise.

• Departments
• Editor's Note
• Green engineering matures
• News Briefs
• News Briefs
• Test Voices
• Opaque Windows
• Viewpoint
• How DFT conquers chip complexity

• Features
• Data Acquisition
• Design tradeoffs in data acquisition
• Project Profile
• No power interrupts, please
• RF/Wireless Test
• Protocol stack testing for LTE

• Machine-Vision and Inspection Test Report
• Editor's Note
• Looking through inspection's crystal ball
• Highlights
• Highlights
• Machine-Vision and Inspection Report
• MEMS create 3-D inspection challenges
• Where to put AOI?
• Complex circuits challenge cameras

• Market Trends
• Automated Test Equipment
• Trying times in semiconductor ATE market

• Product Update
• Featured Products
• Analyze HDMI audio streams
• Simulate and develop wireless systems
• Sensor captures vehicle crush zone data
• Test system supports all A-GPS test cases
• 300-MHz PXI, PCI, and VXI oscilloscopes
• Lock-in amplifier boasts low noise
• Power amplifier delivers 40 kV
• Hipot wire harness tester
• USB DMM has 6½ digits
• A 12-GHz PC-based oscilloscope
• Xantrex introduces triple-output digital power supplies
• Event data recorder integrates F-RAM memory

• Tech Trends
• Instrumentation
• Oscilloscopes support the video craze

• Test Digest
• Environmental Test
• Improve thermal cycling time
• Instruments
• When power supplies don't meet specs
• Webcast
• Inject voltage pulses and troubleshoot