Test & Measurement World - December 1, 2008

Our editors have selected the finalists for the Best in Test awards and the Test of Time award. Read about the finalists and help us choose the best of the best. Voting deadline is February 6, 2009.

• Departments
• Editor's Note
• Big tester on campus
• News Briefs
• News Briefs
• Show Highlights
• Electronica: Test, inspection products introduced amid economic uncertainty
• ITC: CAST established as test products debut
• Test Voices
• Make mine melamine
• Viewpoint
• Complexity breeds quality challenges

• Features
• Instruments
• Tune and test DDR memory
• Production Test
• Diagnosis-driven yield analysis
• RF/Wireless Instruments
• Testing E-OTD
• Test Ideas
• Test Ideas: Produce AC test signals

• Machine-Vision and Inspection Test Report
• Editor's Note
• Seeing more, smaller, and faster
• Highlights
• Highlights
• USB 2.0 cameras target small systems
• Machine-Vision and Inspection Report
• Machine-vision software goes independent
• Line-scan cameras adjust to low and variable speeds

• Market Trends
• VXI/PXI Test Equipment
• Competing bus technologies continue to coexist

• Product Update
• Featured Products
• Digitizers target auto/aero test
• Interface converts RS-232 to USB
• JTAG Technologies debuts boundary-scan I/O module
• MSOs focus on serial buses
• V6000 tests both flash and DRAM

• Tech Trends
• Instrumentation
• On-chip testers gain momentum

• Test Digest
• Compliance
• RoHS standards present moving target
• Electrostatic Discharge
• ESD tests generate different results
• Instruments
• Testing inverters for backlighting

• Viewpoint
• Complexity breeds quality challenges (continued)