Test & Measurement World - June 1, 2009

When Altera began developing its 40-nm Stratix IV FPGA, the company’s engineers faced daunting challenges on many design and test fronts. Their efforts spanned the gamut from working with foundry TSMC in order to perfect the 40-nm process in which the device would be fabricated all the way to developing the software and IP that would allow customers to apply the device.

• Departments
• Editor's Note
• Will electronic ink save print?
• News Briefs
• News Briefs
• Test Voices
• Arts and crafts for test
• Viewpoint
• Tools to tackle costs and complexity

• Features
• Semiconductor Test
• Small-delay-defect testing
• Test Ideas
• Test Ideas: Emulate SPI signals with a digital I/O card

• Machine Vision and Inspection Test Report
• Editor's Note
• Solar, HDI light up inspection
• Highlights
• Highlights
• Machine vision aids solar-cell inspection
• Machine Vision and Inspection Report
• Windows-compliant driver speeds 1394 cameras
• AOI and AXI business contracts, machines improve

• Market Trends
• ATE
• Consolidation: the buzzword in the chip ATE market

• Product Update
• Featured Products
• Record/playback system handles 500 Mbytes/s
• Test socket gets adjustable pressure pad
• ScanWorks supports Intel Xeon processor 5500 series
• Connect voltage and strain through Ethernet
• Field meter adds digital memory

• Tech Trends
• Instrumentation
• Networks work in distributed systems

• Test Digest
• RF Test
• Drive test adapts to VoIP, moves into lab
• Serial Bus Test
• DisplayPort bus demands different tests

• Viewpoint
• Tools to tackle costs and complexity (continued)