Test & Measurement World - October 1, 2009

Engineers at Peregrine Semiconductor have developed unique measurement approaches to test the firm's line of RF switches, whose performance might surpass that of the test equipment in which they might ultimately find use.

• Departments
• Editor's Note
• How many CE devices are enough?
• News Briefs
• News Briefs
• Show Highlights
• Good technology, good products, good gig
• Test Voices
• Hewlett and the Packards
• Viewpoint
• Rebound ahead for semiconductor test

• Features
• Instrumentation
• Divide and conquer signal anomalies
• Test Ideas
• DMM handles logic nanosecond-pulse-width waveforms

• Machine-Vision and Inspection Test Report
• Editor's Note
• Keeping it lean, mean, and simple
• Highlights
• Highlights
• Machine-Vision and Inspection Report
• Stand-alone vision systems get simpler
• Vision system enables zero defects
• Analog cameras still play a role

• Market Trends
• Communications Test
• Market for network-monitoring systems grows

• Product Update
• Featured Products
• Aries adds new CSP test socket
• Get optical signals in shape
• Small antenna covers wide range
• Tektronix spectrum analyzers reach 20 GHz
• Spirent adds 40G/100G test capabilities
• Stand-alone logger reads temperature and RH
• Signal analyzer permits CPU upgrade
• PCB unveils Series 4115K rotary torque transducers

• Tech Trends
• Instrumentation
• The technical divide

• Test Digest
• Product Tryout
• Handy instrument needs cleaner install
• Semiconductor Test
• Characterizing noise in voltage-reference ICs