Test & Measurement World - December 1, 2009

Test & Measurement World's editors have searched through many commendable products, nominated by vendors, that were introduced between November 1, 2008, and October 31, 2009. Now, it is up to you to help us choose the best of the best.

• Departments
• Editor's Note
• EcoCAR sponsors help students
• News Briefs
• News Briefs
• Show Highlights
• Vendors tout cameras, interfaces, and processing
• New failure mechanisms, analog, and adaptive test
• Lab and characterization tools debut at Productronica
• Test Voices
• Winter reading: windmills and prostheses
• Viewpoint
• Wireless: prime engine for communications test

• Features
• Awards
• Vote for the Test of Time 2010
• EMC Test
• Anechoic chambers rise from the pits
• RF/Microwave Test
• ATE facilitates WiMAX RF test and characterization
• Semiconductor Test
• The changing role of diagnosis in yield analysis
• Test Ideas
• Signal generator runs on Visual Basic

• Machine-Vision and Inspection Test Report
• Editor's Note
• The need for speed
• Highlights
• Highlights
• Machine-Vision and Inspection Report
• Subsurface solar-cell characterization
• Multilane AOI speeds PCB inspection
• CCD and CMOS sensors become more finely tuned

• Market Trends
• Communications Test
• WiMAX and LTE—4G-ing ahead

• Product Update
• Featured Products
• Basler debuts low-cost GigE camera
• PCIe cards provide bus-level timing
• JTAG tools support board debug
• Measure vibration on four channels
• LCR meter has two interfaces
• Switch/measure line gains transient-capture module
• Monitor 10-Gbps IP networks
• PIM analyzer offers user-selectable Tx frequencies
• Probe card for LCD drivers offers extended life

• Tech Trends
• Instrumentation
• Smartphones tax mobile networks

• Test Digest
• Instrumentation
• Build your own capacitance meter
• PC-Based Instruments
• PXI expands to multiple processors
• Instrument bus standard announced