ITC: Intellitech targets chip and PCB test at ITC
-- Test & Measurement World, 10/3/2003 2:00:00 AM
—Rick Nelson, Executive Editor
October 2, 2003, Charlotte, NC. Intellitech (www.intellitech.com) chose the International Test Conference held here this week to demonstrate tools for both chip and PCB test. On the chip front, it demonstrated its Nebula Silicon Debugger tool, which, says Intellitech CEO C. J. Clark, speeds development time from weeks to half a day through its direct knowledge of on-chip design-for-test structures and its integrated support of Synopsys (www.synopsys.com) TetraMax patterns and diagnostic capabilities. Nebula, which loosely stands for network-based debug and logic analysis, enables remote testing of prototype silicon for stuck-at faults and path-delay faults; it also tests for built-in-self-test functionality.
Compatible with muxed-scan and LSSD (level-sensitive scan design) protocols and with the IEEE 1149.1 boundary-scan standard, Nebula supports in situ functional debug (with a device under test soldered to a PCB, for example). With access to a circuit’s TetraMax fault-simulation library, Nebula can isolate failures to the gate and net level. Nebula includes software support for external instruments such as power supplies, signal generators, and environmental chambers. It supports VISA (Virtual Instrumentation Software Architecture) and IEEE 488 interfaces. Price is approximately $50,000 for the Nebula desktop hardware and floating software license.
On the PCB front, Intellitech demonstrated its PT100, which enables the simultaneous test and configuration of an unlimited number of PCBs that comply with the IEEE 1149.1 standard. The tester balances test times with handling times to optimize throughput. It preserves individual access to each unit under test so it can program, for example, a unique serial number.
The PT100 itself is a collection of self-contained parallel-tester-card building blocks connected by a flexible ribbon cable. The cards are housed in 19-in. 3U-height rack-mountable boxes, each of which can hold 16 cards. Each card supports one IEEE 1149.1 controller and 24 reconfigurable tester channels (providing 0.8 V to 5 V at up to 84 mA). The IEEE 1149.1 interface can transfer data at 64 Mbits/s. Each tester card also has a high-speed clock channel that supports clock rates to 500 MHz. A secondary connector permits integration of the PT100 with automated board handlers and external fixturing.
A single PC employing an Intellitech PXI or PCI interface card and running the company's Scan Executive software controls the tester cards. Users can employ the company's Eclipse Test Development Environment to develop test programs. A four-card version costs $9750; additional cards cost $1800.
ITC has gained a reputation as a chip-centric show, although this year’s conference does include a workshop emphasizing board and system test. I asked Clark whether his exhibit, with both chip- and board-test offerings, was seeing more visitors interested in chips than boards. He suggested that this year’s show remains chip-centric, with the majority of his visitors focusing on the Nebula.
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