Test system leverages PXI flexibility
Staff -- Test & Measurement World, 6/1/2006 2:00:00 AM
To enable expansion as production test needs change, Digitaltest is offering the MTS300 Sigma test system with PXI-based instrument options. Sigma test systems provide analog and digital in-circuit test capabilities, vectorless testing, functional test, boundary scan, and onboard programming. Designed for high throughput, the MTS300 performs up to 1000 measurements/s.
Initially, the system will be configured with a National Instruments PXI-6115—a multifunction data-acquisition card that provides two 12-bit analog outputs, eight digital I/O lines, two 24-bit counters, and analog triggering. Other boards are available on request.
An inline version of the Sigma tester is available with a PXI rack to allow for system expansion as well as rack space for VXI and IEEE 488 instruments. Digitaltest, www.digitaltest.de
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