News Briefs
-- Test & Measurement World, 12/1/2008 2:00:00 AM
Advantest debuts analog IC and memory test systems
Advantest recently introduced the 266-MHz T5782 memory test system for MCP/flash devices and memory-embedded microcontrollers, while the company’s Kyushu Systems subsidiary has announced the ADS1911 test system for low-pin-count analog devices.
The T5782 memory test system provides 266-MHz/533-Mbps performance and targets flash memories as well as devices with memory-embedded microcontrollers. It can test KGD (known-good die) and MCP (multichip package) memory devices. The T5782 system can simultaneously test up to 256 devices and provides the performance of its predecessor, the T5781, with a footprint half the size. The T5782 also incorporates flash functions such as ECC (error checking and correction) and block management. Like the T5781, the T5782 offers both flash memory and DRAM test capabilities, enabling MCP test in addition to flash memory wafer and package test. Test programs developed on the company’s T5781ES (engineering station), a tester designed for lab use, can be used for wafer test on the T5782 and for volume production on the T5781. Base price: 77 million yen.
The ADS1911 analog test system offers low-cost test for comparatively low-pin-count analog ICs (up to 32 pins), and it supports parallel test of up to eight discrete devices and analog ICs. To ensure accurate DC test, the ADS1911 is equipped with a DC calibration function that allows for minimal performance gaps between multiple installed systems, improving yield and bringing down cost. The system’s test-program creation tool allows users to select test parameters from pull-down menus, eliminating the need for knowledge of specialized programming languages. Depending on configuration, the system can deliver voltages to ±128 V and currents to ±64 mA; it can also deliver 2-A pulse currents. Base price: 10 million yen. www.advantest.com.
Rohde & Schwarz announces earnings
Rohde & Schwarz celebrated its 75th anniversary in November, with executives expressing confidence in the future despite the economic crisis facing the world. While noting that no company is immune to economic disruption, president and CEO Michael Vohrer said that Rohde & Schwarz is well-positioned with its product offerings.
Announcing a net revenue of 1.4 billion euros for the past fiscal year (July 2007 to June 2008), Vohrer reported that the company achieved a year-end result comparable to the result for the previous year. Altogether, the electronics group has four main areas of business: test and measurement, secure communications, broadcasting, and radiomonitoring and radiolocation. The company says it was able to sell more instruments, particularly in the test and measurement and broadcasting fields, and that it continued to expand internationally, as evidenced by the regional headquarters it established in Singapore this past year.
“The entire economy is currently in a difficult situation, one in which it is important to practice entrepreneurial caution,” Vohrer said. “We are therefore keeping a close eye on what occurs on the market, and we are applying a mixture of measures for promoting growth and reducing costs.” www.rohde-schwarz.com.
Fujitsu chooses Keithley system
Keithley Instruments reports that it is developing a production test system for two 802.16e WiMAX devices from Fujitsu Microelectronics. The manufacturing test setup, which features Keithley’s Model 2820 RF vector signal analyzer and Model 2920 RF vector signal generator, will enable Fujitsu to perform a set of Tx and Rx test sequences and also test WiMAX devices in both SISO (single input, single output) and MIMO (multiple input, multiple output) modes. The system can generate MIMO signals with under 1 ns of timing alignment and less than 0.1° of phase jitter.
“WiMAX is quite possibly the most complex modulation scheme in the world, encompassing multiple technologies, and this complexity has made testing a challenge for manufacturers,” said Mark Hoersten, VP of business development for Keithley. “Keithley’s WiMAX test solution will enable Fujitsu Microelectronics to test in any frequency band between 400 MHz and 6 GHz faster and more easily than any competing offering.” www.keithley.com; www.fujitsu.com.
Testronic tests WUSB products with Tek system
Tektronix has announced that Testronic Laboratories will be using the Tek UWB WiMedia compliance test solution to provide WUSB (wireless universal serial bus) interoperability testing at its test and certification centers. The UWB WiMedia system comprises the AWG7000 arbitrary waveform generator, the TDS6154C oscilloscope, and UWB (ultrawideband) spectral analysis software. Testronic Labs has been accredited by the USB Implementers Forum as an Independent Test Lab for testing and certification of WUSB products.
“Testronic Labs is the first test laboratory in Europe to be accredited to provide compliance testing and certification services for WUSB products and we are delighted that they chose our products to achieve this capability,” said Lynne Camp, VP, Performance Products, Tektronix. www.tektronix.com; www.testroniclaboratories.com.
Design your own PXI module
National Instruments has merged its LabView FPGA development software with a PXI module to create a platform for custom testers. The company’s FlexRIO platform puts an FPGA on a PXI card. You can develop your own test module by programming the card’s Xilinx FPGA with LabView to perform signal processing or to analyze serial data protocols. Through LabView FPGA software, you can gain access to 66 differential digital signals on the FPGA that run at speeds up to 1 Gbps. For singled-ended operation, you get 132 pins at speeds up to 400 Mbps.
The PXI module needs an adapter card that connects your signals to the FPGA. Currently, NI provides a digital adapter (NI 6851) that lets you connect 54 single-ended channels to the FPGA. Voltage levels include 1.8 V, 2.5 V, and 3.5 V (5-V compatible). The NI 6851 adapter can transfer signals at 100 MHz, which means you can test DDR (dual-data rate) memory at 200 MHz.
Base prices: NI FlexRIO FPGA modules—$2999; NI 6851 adapter module—$999; FlexRIO development kit—$4999. National Instruments, www.ni.com.
Calendar
OFCNFOEC, March 22–26, San Diego, CA. Managed by the Optical Society of America. www.ofcnfoec.org.
Measurement Science Conference, March 23–27, Anaheim, CA. Sponsored by Measurement Science Conference. www.msc-conf.com.
APEX, March 31–April 2, Las Vegas, NV. Sponsored by the IPC. www.goipcshows.org.
The Vision Show, March 31–April 2, Phoenix, AZ. Sponsored by the Automated Imaging Association. www.machinevisiononline.org.
To learn about other conferences, courses, and calls for papers, visit www.tmworld.com/events.
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