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Electron microscope

Staff -- Test & Measurement World, 5/1/2005 2:00:00 AM

FEI has announced the Titan 80-300 scanning/transmission electron microscope (S/TEM), which yields atomic-scale imaging with resolution below 0.7 Angstrom. The Titan announcement comes one year after FEI achieved sub-Angstrom resolution on its Tecnai microscope using a monochromator and an aberration corrector. FEI says the Titan 80-300 is designed as a dedicated and upgradeable aberration-corrected system that will enable corrector and monochromator technology to enter into mainstream nanotechnology research and industrial markets. FEI Co., www.feicompany.com.

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