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Pintail offers free test-time optimization program

-- Test & Measurement World, 7/14/2009 9:00:00 AM

TestVision/6 is a set of analytical tools that enables users to analyze historical test-data logs to quickly determine the best test-time optimization plan for deployment using Pintail's online SwifTest software. It optimizes both parametric and functional test times and includes new algorithms that produce larger test-time savings compared to previous versions.

SwifTest-TTO is an adaptive-test solution for reducing test time on complex semiconductors. A key benefit of adaptive test is that engineers need not be limited to worst-case conditions. SwifTest-TTO dynamically applies statistical sampling in proportion to the quality levels indicated during real-time production. More variability will result in less test-time savings. But as yield improves, significant test time can be saved.

TestVision/6 allows you to perform these TTR (test time reduction) analyses within minutes. You can load multiple data files (STDF, TEDS, etc.) and explore the entire range of TTR options for a particular device. Even if you are not interested in test-time reduction, TestVision/6 provides a data browser that lets you quickly view the behavior of tests over the course of a lot.

For the remainder of 2009, Pintail will be offering TestVision/6 to qualified users at no charge. Further details can be obtained by sending an email request to taylor.scanlon@pintail.com.

Pintail Technologies, www.pintail.com.

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