2007 Best in Test Awards- Honorable Mentions
Our editors selected a variety of products to receive Honorable Mention honors as part of our 2007 awards.
Staff -- Test & Measurement World, 12/1/2006 9:07:00 AM
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Awards overview
Honorable mentions Online ballot 2007 Best in Test main page |
Each year, Test & Measurement World's editors present the Best in Test awards to products we think are particularly innovative or useful.
The following are the products we chose as 2007 Honorable Mentions. T&MW's editors narrowed this year's field from scores of deserving products, nominated by vendors, that were introduced between November 1, 2005, and October 31, 2006.
2007 Best in Test Honorable Mentions
WaveRunner 204Xi oscilloscope
LeCroy, www.lecroy.com
The WaveRunner Xi series with its 6-in. depth and 10.4-in. touch-screen display brings the form factor of LeCroy’s WaveSurfer family to the company’s midrange line of scopes. The 600-MHz, four-channel scope offers fast viewing with color-gradient displays. It operates at up to 10 Gsamples/s and updates the screen 8000 times/s. Options include a 32-channel logic probe, CAN bus triggering and decoding, power measurements, jitter measurements, digital filtering, EMI measurements, and up to 24 Msamples of waveform memory.
SystemBIST FPGA configuration device
Intellitech, www.intellitech.com
SystemBIST is a plug-and-play IC for flexible FPGA configuration and embedded PCB self-test. It loads designs into RAM-based FPGAs upon power-up, eliminating the need for serial configuration PROMs. SystemBIST can configure any IEEE 1532 or IEEE 1149.1 compliant FPGA. The IC stores IEEE 1149.1-based test patterns and scripts compressed in flash memory, enabling PCBs to be tested anywhere that they can be powered. This second-generation device also offers fail-safe FPGA updates in the field.
Vanguard Express AMC protocol & link analyzer
Vmetro, www.vmetro.com
The Vanguard Express AMC is a protocol and link analyzer for debugging, testing, and validating PCI Express in the AdvancedMC (AMC) form factor and, when used with an adapter, other form factors as well. The analyzer installs between the device under test and the host system and is controlled through a USB or Ethernet interface. Users decode the PCI Express protocol with the BusView 5 software. Trace data can be arranged in chronological order or grouped as link or split transactions.
BBWGD 16-channel mixed-signal module for SoC test
Advantest, www.advantest.com
Advantest’s Base Band Waveform Generator Digitizer (BBWGD) is a 16-channel mixed-signal module that lets you test multisite, multichannel system-on-chip devices used in mobile phones, set-top boxes, DVD players, and WLAN baseband equipment. The high channel density and mixed-signal capability of the board satisfies diverse test needs while delivering accuracy and flexibility. The BBWGD module further extends the capabilities of the T2000 SOC test platform, which is based on the OpenStar open architecture specifications.
AV6010 IC package & memory card inspection system
SolVision, www.solvision.net
In addition to inspecting conventional IC packages, the AV6010 performs package defect inspection and precise 2-D/3-D measurements on all types of memory cards, including MMCPlus, MMCMobile, MMCmicro, SD, miniSD, and microSD form factors. The AV6010 offers dual-sided in-tray inspection and advanced defect-detection capabilities, such as true 3-D measurement and warpage detection. It even detects label peeling and bubbles, which can affect memory card compatibility.
SigmaSure RMA Insight Web-based software
SigmaQuest, www.sigmaquest.com
The SigmaSure RMA Insight software enables OEMs to gain detailed knowledge of products returned by users. The Web-based software aggregates data from various sources, including return material authorization (RMA) databases, so OEMs can quickly learn the causes of product defects and gain statistical knowledge about product performance trends. With RMA Insight, you can drill down to get a single view of what, when, where, and how failures occur. In addition, OEMs can expedite product upgrades and recalls.
Optixia XM IP test system
Ixia, www.ixiacom.com
The Optixia XM is a single-chassis IP test platform that emulates voice, video, and data to the scale of a service provider. With the IxLoad and IxNetwork software, engineers can emulate IPTV and triple-play subscribers and test complex network topologies consisting of thousands of devices. The Optixia XM allows engineers to direct both real-world application and conventional packet-based network traffic over Internet-scaled, emulated IP/MPLS network topologies to determine subscribers’ quality of experience.
UEILogger datalogger
United Electronic Industries, www.ueidaq.com
Offering more than 20 I/O boards, including serial and CAN bus inputs, the UEILogger gives you the flexibility to match datalogger I/O to a variety of applications. A six-slot version of the rugged datalogger/recorder accommodates up to 150 analog or 288 digital I/O channels and provides sampling rates of up to 100 samples/s on each channel or port; the unit logs data onto a 2-Gbyte SD memory card, which stores more than 500 million 16-bit analog-to-digital readings. The UEILogger operates from –45°C to +85°C and withstands 50-g shock and 5-g vibration.
N9020A MXA signal analyzer
Agilent Technologies, www.agilent.com
Delivering the measurement speed of a high-end signal analyzer, the N9020A MXA mid-range analyzer (base price: $25,900) produces a W-CDMA ACLR fast-mode measurement speed of &14 ms, marker peak search at &5 ms, and RF center frequency tune and transfer over GPIB at &51 ms. Measurement-mode switching speeds are typically &75 ms. The MXA platform supports multiple frequency ranges up to 26.5 GHz, internal preamplifiers up to 26.5 GHz, and analysis bandwidths of 10 MHz or 25 MHz.
Signature MS2781B signal analyzer
Anritsu, www.us.anritsu.com
The Signature MS2781B provides spectrum analysis and integrated vector signal analysis over a frequency range of 100 Hz to 8 GHz with bandwidths to 50 MHz. The instrument offers a seamless interface to Matlab for extended analysis and visualization. Built-in one-touch "smart" measurements and optional personalities for phase noise, WiMax, WCDMA/HSDPA, and QAM/PSK modulation analysis ease measurements on complex signals.
DPO4000 oscilloscopes with Wave Inspector
Tektronix, www.tektronix.com
Covering a range of 350 MHz to 1 GHz, the DPO4000 series of oscilloscopes is the first from Tektronix to offer the Wave Inspector tools for efficient viewing, navigation, and analysis of waveform data in a matter of seconds. The DPO4000 provides a standard record length of 10 million points, and Wave Inspector provides front-panel controls for zooming, panning, playing and pausing, setting and clearing user marks, navigating between marks, and searching for user-defined events throughout the 10-million-point record.
DT9837 USB sound and vibration acquisition module
Data Translation, www.datatranslation.com
Powered through a USB connection to a laptop computer, the DT9837 accepts four simultaneous 24-bit IEPE sensor inputs that are synchronized with a tachometer input. You can use the DT9837 for performing portable sound and vibration measurements in applications such as automotive test, acoustics, and sonar. The module delivers a sampling rate of over 52 kHz per input channel and provides an analog input range of ±10 V with software-selectable gains of 1 and 10.
ZT4610 oscilloscopes
ZTEC Instruments, www.ztecinstruments.com
The ZT4610 family brings benchtop oscilloscope capabilities to the VXI, PCI, and CompactPCI/PXI platforms. Each 8-bit model delivers a 4-Gsamples/s sampling rate with 800-MHz analog bandwidth. With record length options of 16- through 128-Msamples, the ZT4610 provides the deep memory required for acquiring complex signals. An analysis library includes typical oscilloscope vertical, horizontal, and frequency measurements. The PCI and PXI models offer two channels; the VXI model is available in both two- and four-channel versions.
Medalist iVTEP vectorless test software
Agilent Technologies, www.agilent.com
Medalist iVTEP (Intelligent Vectorless Test Extended Performance) software addresses the challenges in PCB testing brought on by ultra-small device packages with minimal or no lead frames. The new iVTEP builds on vectorless test capabilities of the company's earlier VTEP and TestJet technologies, enabling more accurate measurements to be made on ICs. Medalist iVTEP is a software upgrade that works with any Medalist i5000 or 3070 in-circuit test system equipped with a VTEP-compatible fixture.
V93000 HSM high-speed DRAM tester
Verigy, www.verigy.com
Intended for the final testing of high-speed memories, the V93000 HSM Series DRAM tester boasts 3.6-Gbps at-speed I/O and 3.6-Gbps at-speed memory core test functions. Besides providing fast data rates, the V93000 HSM Series leverages a scalable per-pin timing architecture that makes it adaptable for emerging DRAM technologies. It features fast yield learning, 16X site parallelism in a single test, and source synchronous and parallel eye-finding functions to support new I/O concepts for GDDR and XDR technologies.
CNT-90XL microwave counter/analyzer
Pendulum Instruments, www.pendulum-instruments.com
The CNT-90XL is a combined frequency counter and power meter for continuous wave and burst signals that delivers a measurement speed of up to 250,000 frequency samples/s. It displays frequency changes over time for analysis of fast FM/AM, frequency/power settling and drift, and frequency/power drop out. Built-in statistical processing presents numerical stability data as well as frequency/power distribution histograms. Versions of the CNT-90XL cover frequencies up to 27 GHz, 40 GHz, 46 GHz, and 60 GHz.
Siloti SilVE visibility enhancement tool
Novas Software, www.novas.com
Siloti SilVE visibility enhancement software helps engineers investigate complex IC and system-on-chip behavior for verification and system validation applications incorporating design-for-debug (DFD) methodologies. It compiles the HDL design and performs an analysis to identify essential signals in order to minimize the set of signals probed during silicon prototype. Siloti SilVE also correlates silicon data to the RTL source code and waveform views to aid in debugging. Users can optimize signal visibility using DFD logic while minimizing the impact on chip resources.
Optical backscatter reflectometer
Luna Technologies, www.lunatechnologies.com
Luna’s Optical Backscatter Reflectometer (OBR) with distributed sensing transforms telecom-grade fiber into a high-spatial-resolution strain and temperature sensor. The OBR uses swept wavelength interferometry to measure the Rayleigh backscatter as a function of length; it measures shifts in the backscatter pattern and scales them to give a distributed strain or temperature measurement with resolution as fine as 1 µstrain or 0.1°C. The OBR measures reflections with 125-dB sensitivity, 60-dB dynamic range, and 40-µm spatial resolution for up to 500 m of optical length.
Eclipse MA100 inverted metallographic microscope
Nikon Instruments, www.nikonusa.com
The Eclipse MA100 inverted microscope is designed for reflected-illumination brightfield and simple polarizing observation and analysis of prepped materials and metallurgical samples, and its stable three-plate structure stage enables it to handle heavy samples. The MA100 is equipped with Nikon CFI-60 optics, which provides high numerical apertures and long working distances. To simplify polarization illumination, the polarizer and analyzer are linked so they are easily engaged from a single-action lever.
Wonder Wave 2074 waveform/function generator
Tabor Electronics, www.taborelec.com
The Wonder Wave 2074 four-channel arbitrary waveform/function generator operates at 200 Msamples/s with 16-bit vertical resolution. It outputs waveforms over a range of 100 µHz to 80 MHz, and all four output channels are synchronized to the same reference clock. The internal frequency reference has 1-ppm accuracy and stability over a period of one year. An external frequency reference is provided for applications requiring greater accuracy. The 2074 comes with Ethernet, USB 2.0, and GPIB control interfaces, as well as ArbConnection software.
E2960B Series protocol analyzer/exerciser for PCIe2
Agilent Technologies, www.agilent.com
The E2960B integrates a complete x1 through x16 protocol analyzer, Link Training and Status State Machine (LTSSM) exerciser, midbus probes for nonintrusive measurements, and a gateway to logic analysis for PCI Express 2.0. Since the E2960B is based on the company’s N2X platform, upgrading to PCIe2 allows reuse of chassis and probing solutions for PCIe1 applications and the use of backward-compatible API and scripts. The P2L protocol-to-logic gateway links the protocol analyzer to a logic analyzer to permit cross triggering and marker correlation.
DSG9000 HD radio test signal generator
Noise Com, www.noisecom.com
The DSG9000 signal generator transmits vector signals via cables or audio antennas into an HD-type radio, allowing engineers to test both the analog and the digital circuitry. The DSG9000-02 contains a full suite of test vectors and can be used to analyze noise, distortion, and multipath errors on new designs. The DSG9000-01 is designed for production testing and includes one vector for AM and a second vector for FM. The intuitive interface helps broadcast engineers who are not familiar with test and measurement operations.
R&S ESU EMI test receivers
Rohde & Schwarz, www.rohde-schwarz.com
The R&S ESU family of CISPR-1-1-compliant EMI test receivers meets civil and military standards for electromagnetic interference measurements. With the FFT-based time-domain scan, you can perform overview measurements more than 100 times faster than on previous test receivers. The instruments provide a complete set of parallel detectors (including the new CISPR-RMS detector), RF scan, IF analysis, and numerous report functions. Three models are available covering frequency ranges from 20 Hz up to 8 GHz, 26.5 GHz, or 40 GHz.
Model 2910/2810 vector signal generator/analyzer
Keithley Instruments, www.keithley.com
Useful for automated wireless device testing, the combination of the Model 2910 vector signal generator and the Model 2810 vector signal analyzer employs a digital software-defined radio architecture and DSP/FPGA design to achieve high speed, ease of use, and low cost (base price: $15,000 each). Both instruments have a digital up/downconverter synthesizer that can tune in less than 3 ms. The Model 2810 executes a 200-MHz bandwidth sweep with 100-Hz resolution in less than 15 s. Each unit runs under Windows CE.
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