X-ray system recognizes submicron features
Staff -- Test & Measurement World, 12/1/2007 2:00:00 AM
The XiDAT XD7500NT digital x-ray inspection system from Dage Precision Industries offers a submicron inspection capability and features sealed-tube technology to minimize maintenance. Its manipulator design provides oblique angle viewing of up to 70° for any point of the 18x16-in. (458x407-mm) inspection area.
The XD7500NT comes standard with the Dage NT x-ray tube, providing submicron feature recognition to 950 nm. It provides real-time 1.3-Mpixel digital inspection with results viewable on a 20-in. flat-panel LCD at system magnification up to 7400X. Optionally, the XD7500NT is available with the Dage XiDAT (x-ray integrated digital acquisition technology) 2.0 image-acquisition system, providing real-time digital inspection at 2.0 Mpixels and viewable on a 24-in. flat-panel LCD. It comes equipped with the company’s ImageWizard software.
Dage Precision Industries, www.dage-group.com.
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