Semicon West News:Mosaid Technologies launches memory test system

-- Test & Measurement World, 7/20/2002 2:00:00 AM

Rick Nelson, Senior Technical Editor

SAN JOSE, JULY 19, 2002—Mosaid Technology (www.mosaid.com) this week announced the fifth generation of its memory test system. The new version—the MS4205e^x —offers test speeds to 416 MHz or 832 Gbits/s with data I/O widths of 18 or 36 channels. The MS4250e^x is a small-footprint laboratory-friendly test system that includes a lightweight remote test head.

The system runs under a Windows-based system controller. A graphical sequence editor permits users to rapidly create and modify test programs for various types of memory (for example, quad-data-rate and double-data-rate configurations) using simple Windows-based tools. A bitmap capture feature collects data acquired at maximum tester speed into a compressed database for real-time analysis or subsequent review. Base price: $450,000.

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