July 21, 2005
In this issue, we bring you news of production test equipment that was on display during Semicon West. Plus, check out our archived Webcast to get tips for eliminating noise in data-acquisition systems.
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VXI Technology has introduced the SVM2608 high-performance multifunction VMEbus module.
VXI Technology has introduced the SVM2608 high-performance multifunction VMEbus module. The SVM2608 combines four independent 100 kSa/s A/D converters with built-in measurement functions such as 2- and 4-wire resistance and programmable filtering. For more information or to order a catalog, simply simply visit www.vxitech.com or call 949-955-1894. |
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Noncontact Probe System Targets 65-nm Technology
Suss MicroTec has developed a noncontact probe system that acquires signals from circuits fabricated in 65-nm processes and below without loading the circuit under test. The company demonstrated the system at Semicon West (July 11-15, San Francisco, CA). For more
Agilent Enters Memory Final-Test Market
Agilent Technologies chose Semicon West to introduce its Versatest Series Model V5500, which targets single-insertion final-test applications for multichip-package devices and discrete flash memory. For more
Advantest T2000 Module Targets Serdes Test
Advantest has introduced a digital module designed to enable low-cost, flexible testing of system-on-chip devices incorporating serializer/deserializer communications interfaces.
For more
Pulse-Measurement and 65-nm-Probing Capabilities
Highlight Keithley Exhibit
Keithley Instruments chose Semicon West to announce the availability of pulse-generation and measurement capability for its Model 4200-SCS semiconductor characterization system.
For more
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Willtek's 9102 Handheld Spectrum Analyzer
Willtek's 9102 Handheld Spectrum Analyzer now offers a new reflection measurement option, which supports cable distance-to-fault measurements, and a new RMS detector option. The VSWR/DTF Reflection Measurement Option and VSWR/DTF Bridge enable acceptance and maintenance tests over the desired frequency range of professional antenna systems, such as those used for cellular base stations. The new DTS measurement mode shows all relevant problems that can arise along coaxial cables. Click here.
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GuideTech Femto 2000 CTIA Certified on the Teradyne Flex
GuideTech has announced that its Femto 2000 continuous timing interval analyzer system has passed qualification as a certified open-architecture timing solution for the Teradyne Flex ATE platform. For more
Apria Technology Begins Shipping OpenStar-Compliant
Baseband Instruments
The Semiconductor Test Consortium confirmed at Semicon West that third-party instrument developer Apria Technology has started shipping its OC800 OpenStar-compliant baseband AWG and digitizer modules. For more
Sapphire D-10 Targets Consumer ICs
Credence Systems has unveiled the Sapphire D-10, a high-throughput, multi-purpose wafer-sort and final-test system designed to address the economic requirements of the microcontroller, wireless-baseband, display-driver, and low-cost consumer mixed-signal device markets.
For more
Electroglas, Credence Collaborate on Integrated Strip Test
Electroglas, a supplier of wafer probers and prober-based test-handling systems for the semiconductor industry, has announced that it is working with Credence Systems to provide an integrated test cell for testing devices in strip format for a major US electronics component manufacturer. For moreNew FormFactor Debuts NAND Probe Card, Announces Prober Milestone
FormFactor announced at Semicon West full-volume commercial production of its FormFactor NF150S wafer probe card for large-area arrays tailored to the growing NAND flash market demand. For moreSockets and Probes at Semicon West
Semicon West saw the demonstration of a variety of test probes, contactors, and sockets from Aries Electronics, Synergetix, Kulicke & Soffa, and Johnstech. For moreCompact System Offers Zero-Footprint IC Test
At Semicon West, ProductionLine Testers demonstrated its IC-100 general-purpose benchtop semiconductor tester, which can mate with a handler or prober to provide a zero-footprint manufacturing test system. For more
Are Your Signals Noisy?
Does your data-acquisition system capture too many noisy signals? Trying to find the source of the noise? Check out our archived Webcast, "Overcoming Noise in Data Acquisition," co-sponsored by Yokogawa and Test & Measurement World and originally presented on July 20. The Webcast outlines several sources of noise in PC-based data-acquisition systems and provides methods for eliminating each one. For more
Upcoming Trade Shows and Conferences
EMC Symposium
August 8-12, Chicago, IL
Sponsored by IEEE, EMC Society
NIWeek
August 16-18, Austin, TX
Sponsored by National Instruments
Semiconductor Packaging Strategies Symposium
August 25, San Jose, CA
Sponsored by MEPTEC, the MicroElectronics Packaging and Test Engineering Council
EOS/ESD Symposium
September 11-16, Anaheim, CA
Sponsored by ESD Association
Joint International IMEKO TC1+TC7 Symposium
September 21-24, Weimar, Germany
Sponsored by Technische Universitat Ilmenau
To learn about other conferences, courses, and calls for papers, visit ourIndustry Calendar. |
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