Virage Logic offers reconfigurable embedded-memory system with test and repair options
-- Test & Measurement World, 7/15/2002 2:00:00 AM
Building on its first-generation Self-Test and Repair (STAR) memory system, Virage Logic (www.viragelogic.com ) has announced an embedded reconfigurable version designed to increase yield regardless of memory size or type. The new system eliminates the need to use expensive laser equipment.
With the new system, called the Re-configurable STAR memory system, Virage Logic takes aim at manufacturing defects that may not surface immediately upon wafer testing—for instance, process variations may contribute to faults that programmed test algorithms don't detect. The system helps to compensate for memory problems that materialize after silicon tape-out—in the factory or in the field.
Each Re-configurable STAR memory system consists of a STAR processor; one or more STAR memories; one or more area, speed, and power (ASAP) memories; nonvolatile fuses; and programmable memory. To achieve optimal area, speed, power, and yield targets, the company has integrated its ASAP embedded memories with its embedded memories that incorporate redundancy into a single design.
Virage Logic employs its non-volatile electrically alterable (NOVeA) technology to replace laser programmable fuses in the new memory system. Because NOVeA technology is available in a standard logic process, it can be integrated cost effectively on the same chip.
STAR memories are not susceptible to any memory performance degradation over time, unlike strategies (such as error checking and correction) that bypass defective locations and can contribute to high leakage currents.
The Re-configurable STAR Memory System will be available in September 2002 in 0.18-micorn and 0.13-micron processes with prices starting at $200,000.
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