Memory tester

Staff -- Test & Measurement World, 2/1/2004 2:00:00 AM

Leveraging fast, powerful parallel test capabilities, the T5377 tests up to 256 memory devices simultaneously at speeds of 143 MHz or 286 MHz for double-data-rate memories. What's more, the system is flexible enough to perform both front-end and back-end flash memory test and employs a new system architecture to improve failure identification. Advantest, Santa Clara, CA. 408-988-7700;www.advantest.com.

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