Mesuro launches commercial active load-pull system
The MB Series systems can measure RF waveforms, power spectrum, S-parameters, and DC IV characteristics.
-- Test & Measurement World, 6/16/2009 9:28:00 AM
Mesuro announced the introduction of its MB Series active load-pull systems at IMS 2009. The MB Series enables device and power-amplifier manufacturers to characterize their devices within an accelerated amplifier design cycle while improving operational reliability and achieving near theoretical efficiency in fewer design iterations. The efficient designs the systems enable result in increased battery life for mobile device users, and lower electricity bills for network operators; both aspects reduce CO2 emissions.
The MB Series systems can measure RF waveforms, power spectrum, S-parameters, and DC IV characteristics utilizing a new measurement architecture that offers stability with no wideband artifacts. The MB 20 tests devices and power amplifiers up to 20 W CW, while the MB 150 extends the power level up to 150 W CW.
Mesuro’s “Waveform Engineering,” pioneered at Cardiff University, enables the replication of S-parameter concepts within the nonlinear domain. The solution simultaneously measures the actual current and voltage at a DUT, allowing designers to view and engineer their waveforms to match theory.
In cooperation with Mesuro at IMS 2009, AWR exhibited its new “Cardiff Model,” available on AWR’s Microwave Office Design Environment 2009. Modeling engineers will be able to characterize their device or power-amplifier for any signal and impedance environment.
“The Mesuro active load-pull solutions are an exciting advancement in measurement technology which will greatly reduce challenges facing device and PA designers today,” says Dr Richard Emsley, CEO of Mesuro Limited. “The scientists at Cardiff University have worked closely with industry leaders for many years, and Mesuro has developed a very practical commercial solution.”
The new open loop active load pull technique replaces the use of passive tuners with an RF source that adjusts the amplitude, phase, and power level to vary the effective impedance at the DUT interfaces. The approach allows absolute control of all in-band and out-of-band impedances, enabling the designer to control the harmonic source/load impedance over the entire Smith chart.
Mesuro employs a Tektronix sampling scope to enable simultaneous wideband measurements with a coherent alignment of all spectral components, including the fundamental and multiple higher order harmonics. (See related article, "Tektronix addresses RF/microwave challenges, hosts Mesuro at IMS booth.") In addition, the system measures the DC and baseband response, essential in capturing the often seen memory effects in devices. The modular design of the system offers easy upgradability for higher power, additional harmonics, lower frequencies and more.
www.mesuro.com
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