ITC 2008: Goepel debuts I/O module, details new initiative with SPEA
-- Test & Measurement World, 11/3/2008 11:16:00 AM
At the International Test Conference (ITC), Goepel electronic introduced the SFX-9305 I/O module as new addition to the ScanFlex hardware platform. It also announced extended JTAG functionality for the SPEA 4040 flying prober.
The new I/O module features five independently configurable ports and will provide universal functional test for multiple bus interfaces, including wireless interfaces. The first interfaces supported are USB 2.0 (host) and LAN.
The SFX-9305, based on Goepel’s VarioCore technology, provides five independent, configurable bus ports. The physical target connection is realized by bus access cables (BAC). The current configuration is automatically identified, whereby BAC sort and number can be freely defined. Several SFX-9305 modules can run in parallel. Available interface functions include the step-wise handling of protocol layers, including bidirectional data exchange. Therefore, customers now can completely control the bus target without additional driver software, and clearly identify faults.
The SFX-9305 features three dedicated serial ports. Preconfigured SPI, MicroWire, and I2C interfaces as well as trigger signals are available preconfigured per port. These ports can be used, for example, for the programming of serial flash or the functional control of bus components.
SFX-9305 can be combined with all ScanFlex controllers on PCI, PCI Express, PXI, PXI Express, FireWire, USB, or LAN interfaces. It is supported by Goepel’s System Cascon boundary-scan software. Module programming and test program handling of analog/digital data is provided on basis of Caslan programming-language commands.
“The increasing utilization of gigabit and wireless hitherto created difficult test problems. Now, the new module offers a path breaking solution,” said Raj Puri, marketing and sales VP. “The combination of structural boundary-scan test and multivalent interface test on a unified platform does not only result in significantly higher test coverage but saves investment efforts.”
Extended JTAG functionality for the SPEA 4040 flying prober
Also, Goepel and SPEA introduced additional boundary-scan functions for the SPEA 4040 flying-probe tester in accordance with the companys’ long-term OEM agreement. The new solution is based on the flying-prober ATPG (automatic test program generator) that is integrated in Goepel’s System Cascon JTAG development environment.
“Flying probers combined with boundary scan play an important role in solving problems with reduced test access. The new software features make this platform more attractive,” says Thomas Wenzel, director of the boundary-scan business unit at Goepel. “The support of additional probes, paired with higher interactivity and safety, offers higher test throughput and test coverage than previous versions.” The combination, he adds, serves high-mix/low-volume and to medium-production-volume applications.
“The inherent nature of SPEA’s open software architecture enables the performance of this combination. It allows a third-party software full access to all system resources,” explains Detlef Dein, application engineer for SPEA.
The new features enable Goepel’s extended ATPG tool to work with the flying prober’s bottom probes. The probes work as virtual bidirectional boundary-scan pins in the frame of interconnection tests, enabling extended fault coverage—in particular, for open faults in BGA components. Utilizing the integration of the two systems, the software takes over the probe positioning, using the definition from the SPEA Board Export tool with test points on the upper and lower side of the UUT.
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