SemiProbe announces LA-150 Lab Assistant probe system
-- Test & Measurement World, 2/1/2009 2:00:00 AM
SemiProbe has created a low-cost multifunctional probe system suitable for university and industrial R&D applications that involve simple probing operations yet require system stability, flexibility, and reliability. The LA-150 Lab Assistant comes in both DC and RF/microwave configurations, both of which allow individual manipulator or probe-card contact to the DUT (device under test).
The standard configuration comes with two DC manipulators; a trinocular, stereo zoom microscope; a 150-mm vacuum chuck; and a platen that provides 360° of manipulator placement. Manipulators are magnetic-based and are supplied with coaxial probe arms and a clamping collet to securely hold the probe needle. The microscope is mounted on a boom pole, allowing the scope to be swung away from the probing area during setup. The large platen has a removable front panel to allow for easy loading and unloading while still providing full front manipulator positioning capability.
Built into the platen is a standard 4.5-in. probe-card holder. The hinged platen allows for a simple break-contact operation for all probes and also allows for adjustable platen planarity. The system features a full 25 mm of adjustable z-axis movement and 360° of theta rotation. Gross positioning of the 150-mm chuck is accomplished using a magnetic mount-and-release system. The system may be upgraded to add x-y linear stages (chuck and microscope), a CCTV system, vibration isolation, a thermal chuck, and additional manipulators with a variety of probe arm and base choices.
The 60-lb system comes in a single crate and can be ready to use in less than an hour.
Base price: less than $10,000. SemiProbe, www.semiprobe.com.
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