Best in Test: Archive of Past Winners
-- Test & Measurement World, 5/31/2007 11:32:00 AM
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2004 Best in Test Winners 9101 4-GHz Handheld Spectrum Analyzer, Willtek
Arendar Test Data Management Software, VI Technology
CVS-1454 Compact Vision System, National Instruments
DL7400 Series Digital Oscilloscope, Yokogawa Corp. of America
E2960 Series PCI Express Protocol Analyzers, Agilent Technologies
EmiScope–II Diagnostic System, Optonics, a Credence Co.
GX7100 3U/6U Combination PXI Chassis, Geotest-Marvin Test Systems
Model 3117 Double-Ridged Waveguide Horn Antenna, ETS-Lindgren
PowerDNA Distributed Data-Acquisition System, United Electronic Industries
PT100 Parallel Tester, Intellitech
Sapphire NP SOC Tester, NPTest
WBI-FOX Precision X-Ray Inspection System, Feinfocus
2004 Best in Test Honorable Mentions 100-Msamples/s Mixed-Signal PXI Test Platform, National Instruments
3000 Series PXI Test Suite for Wireless Test, Aeroflex
90IP Instrumentation Platform, FrequencyDevices
Automated Wireless Voice Quality Test System, GLCommunications
Automatiq Test System, AutomatiqMeasurementSystems
Boundary Scan Probe Handheld Tool, GoepelElectronic
Dash 2EZ Data Recorder, Astro-Med
DAQStreaming Data Recorder, ADLINKTechnology
DuraPlus Fine-Pitch Epoxy Probe Card, Kulicke & Soffa
eM-Repair Data Collection and Analysis Software, Tecnomatix Unicam
FastScan ATPG Tool, Mentor Graphics
Fusion HFi SOC Test System, LTX
GPS7500 Noise and Interference Generator, Noise Com
Handyscope-HS3 Multifunctional Measuring Instrument, TiePie Engineering
IxVPN Performance Validation Test Suite, Ixia
Model 4530 RF Power Meter, Boonton
Morphis Frame Grabber, Matrox Imaging
MP1590A Network Performance Tester, Anritsu
N4901A Serial BERT, Agilent Technologies
PETracer ML PCI Express Protocol Analyzer, Computer Access Technology
S600DC/RF Series Parametric Testers, Keithley Instruments
SafeTest Protection Technologies, Teradyne Assembly Test Division
SigmaSure 3.0 Software, SigmaQuest
Sigma Series Oscilloscopes, LDS/Nicolet
SmarTest PG CTL Browser, Agilent Technologies
SMU200A Vector Signal Generator, Rohde & Schwarz
T2000 Series SOC Test System, Advantest America
TDS7000B Series Digital Oscilloscopes, Tektronix
TeraRouting Tester 3.0, SpirentCommunications
ThermaCAM E4 Infrared Camera, FLIR Systems
Tiger SSPE Source-Synchronous ATE Option, Teradyne Semiconductor Test Division
TopCAT Boundary-Scan Tool, Asset InterTech
2003 Best in Test Winners
Ocelot DFT-focused IC testers, Inovys
WaveMaster 8600A oscilloscope, LeCroy
K2-AOI automated optical inspection system, Vectron
PXI-5660 RF signal analyzer, National Instruments
OriginPro 7.0 data-analysis and plotting software, OriginLab
3410 Series digital RF signal generators, IFR Systems
DL 750 Scopecorder oscilloscope, Yokogawa
IDS OptiFIB focused-ion-beam system, NPTest
SoCBIST design-for-test software, Synopsys
Integra FLEX semiconductor test system, Teradyne
81250 ParBERT parallel bit-error-ratio tester, Agilent Technologies
8508A reference multimeter, Fluke
2003 Best in Test Honorable MentionsE1804A integrated optical-switch test system, Agilent Technologies
TMATS/ME7842 tower-mounted-amplifier test system, Anritsu
Fulcrum II Series DSP-based analog/digital data-acquisition board with USB 2.0 port, Data Translation
Test Assistant II cable test-program development software, DIT-MCO International
OPTX10A stressed eye generator for 10-Gbits/s data streams, JDS Uniphase
Model S600DC/RF APT single-insertion DC and RF automated parametric test system, Keithley Instruments
Fusion CX RF and mixed-signal semiconductor test system, LTX
SV-3 Instrument Viewer eyewear-mounted display, MicroOptical
PXI-4070 FlexDMM 1.8-Msamples/s, 100-function instrument, National Instruments
TDS1000 and TDS2000 oscilloscopes with bandwidths to 200 MHz and sampling rates to 2 Gsamples/s, Tektronix
2002 Best in Test Winners
A3303 optical standards tester, Circadiant Systems
1680 and 1690 series logic analyzers, Agilent Technologies
Optima 7350 inspection system, Teradyne
DBS2055 arbitrary waveform generator, Analogic
TestStand 2.0, National Instruments (Test Product of the Year)
SIA-3000 signal integrity analyzer, Wavecrest
IDS PICA probe system, Schlumberger
Accura 100 12-bit oscilloscope, Nicolet
J-260 jitter and timing analyzer, LeCroy
TestKompress DFT software, Mentor Graphics
Self-Test and Repair Memory System, Virage Logic
Suss MFI Real Time Prober, MFI Technologies, a Division of Karl Suss
2002 Best in Test Honorable MentionsAST-20 mechanically refrigerated HALT/HASS test system, Thermotron Industries
DL7200 oscilloscope, Yokogawa
FiberInspect machine-vision system, Cognex
Focal Probe pluggable PCB test-fixture probe, Interconnect Devices
IMAQ Vision Builder 6.0 software, National Instruments
MATLAB Test & Measurement Suite, The MathWorks
ME7808A vector network analyzer, Anritsu
Probe-One memory test system, Teradyne
TDS5000 oscilloscope, Tektronix
VT2000 Measurement/Source Instrument, VXI Technology
2001 Best in Test Winners
Ultima 500 Digital Oscilloscope, Gould Instrument Systems
IHS 1100 Thermal-Control Test Handler, Schlumberger
DT Vision Foundry, Data Translation
MI 4115A Modulated Vector Network Analyzer and Quartet RFIQ ATE Subsystem, Credence Systems
SoftWire 2.0, SoftWire Technology
webDAQ/100 Web-Enabled Data-Acquisition System, Capital Equipment
TDS7000 Series Digital Oscilloscopes, Tektronix (Test Product of the Year)
ATEasy 3.0, Geotest-Marvin Test Systems
Cable-ATS Automatic Cable Modem Test System, Spirent Communications
VersaTenn V Environmental Chamber Controller, Tenney Environmental and Tidal Engineering
Pad Series Contactors, Johnstech
DFT Compiler, Synopsys
2001 Best in Test Honorable Mentions
Catalyst Tiger, Teradyne
DACBIST Designer, Fluence Technology
GoLogic Logic Analyzer, NCI
5DX Series 3 X-Ray Inspection System, Agilent Technologies
FXS-160.40 X-Ray Inspection System, Feinfocus Röntgen-Systeme
SM4042 Relay Scanner/Multiplexer, Signametrics
T6573 125-MHz Test System, Advantest
HPB-3 High-Power Burn-In System, Micro Control
HFP Series Active Probes, LeCroy
Insulation Piercing Test Clip, Pomona Electronics
OTS9000 Optical Test System, Tektronix
2000 Best in Test Winners
Tektronix, TDS3000 Digital Phosphor Oscilloscope Family (Test Product of the Year)
Imaging Technology, NetSight Machine-Vision Engine
National Instruments, NI5911 Digitizer
LeCroy, Waverunner Oscilloscope Series
SPSS, AutoSignal Software
Agilent Technologies, LogicWave Logic Analyzer
Teradyne Assembly Test Division, Spectrum 8950-Series ADSL Tester
Synopsys, TetraMAX ATPG
Yokogawa Corp. of America, PZ4000 Power Analyzer
Agilent Technologies, HP93000 SOC Series Testers
2000 Best in Test Honorable Mentions
µ-3D Visualizer, FeinFocus
ASC-50 Programmable Filter, Frequency Devices
SM-2040 Series DMM Cards, Signametrics
PowerDAQ PD2-MFS Family, United Electronic Industries
iDSC 1816 Data-Acquisition Board, Microstar Laboratories
OPERA Telecom Quality Tester, Opticom
CMU200 Universal Radio Communication Tester, Rohde & Schwarz
3026 Real-Time Spectrum Analyzer, Tektronix
MS2711 Handheld Spectrum Analyzer, Anritsu
Infinum Speech-Recognition Add-on, Agilent Technologies
1999 Best in Test Winners
DI-730 Data-Acquisition System, Dataq Instruments
LabView 5.0, National Instruments (Test Product of the Year)
ATSC/DVB Transport Stream Analyzer, Digital Transport Systems
QuickSilver, Electroglas
Visionscape, Acuity Imaging
2015 Total Harmonic Distortion Multimeter, Keithley Instruments
ICT Probe Series, Interconnect Devices
TestStudio, Teradyne
Fusion HF, LTX
Test Designer and SpiceFarm, Intusoft
1999 Honorable Mentions
Dynamic Test Access Suite, Hewlett-Packard
AccelerATE In-line Testing Architecture, GenRad
Vanguard Laboratory ATE, Integrated Measurement Systems
ZVR Vector Network Analyzer Family, Rohde & Schwarz
Personal DAQ, IOtech
ISIS 2020, ISIS, Infrared Screening and Inspection Solutions
osziFOX Handheld Storage Scope, Pico Technology
Testify Mixed-Signal Fault Analysis Software, Analogy
MT488A-RC IEEE 488 Test Controller, American Distributors
MS9715A WDM System, Anritsu
Wedge Probe Adapter, Hewlett-Packard
Signalyst LSA1000, LeCroy
E8491A IEEE 1394 PC Link Interface, Hewlett-Packard
Digital Phosphor Oscilloscope (DPO), Tektronix
1998 Best in Test Winners
LogicDart, Hewlett-Packard (Test Product of the Year)
Model 4500A RF Peak Power Meter/Analyzer, Booton Electronics
PXI Modular Instrument Platform, National Instruments
Tracer, FLIR Systems
CRX-3D, CR Technology
TLA 700 Series Logic Analyzer, Tektronix
Analog Design and Test Automation Tool Suite, Opmaxx
DTS 2075 Digital Time System, Wavecrest Technologies
Infinium Oscilloscope Family, Hewlett-Packard
icBIST, LogicVision
Digital VirtualTester, IMS
1998 Honorable Mentions
DL708 Modular Oscilloscope and Data-Acquisition System, Yokogawa Corp. of America
PCI-426 2-GHz Sampling Oscilloscope Board, PC Instruments
DSO-2100 Series Digital Oscilloscope, Link Instruments
EMCPro EMC-Immunity Test System, KeyTek
High-Power Burn-In System, Micro Control Co.
UPL Audio Analyzers, Rohde & Schwarz
Model S600 DC Automated Parametric Test System, Keithley Instruments
HP 5DX Series II Automated X-Ray Inspection System, Hewlett-Packard
Origin 5.0 Data-Analysis and Graphing Software, Microcal
MTS200 Series MPEG Test Set, Tektronix
HP 4395A Network/Spectrum Impedance Analyzer, Hewlett-Packard
ML2430A Series of Power Meters, Anritsu Co.
1997 Best in Test Winners
VisionBlox, Integral Vision
HP 54645D Mixed-Signal Oscilloscope, Hewlett-Packard (Test Product of the Year)
Network Measurement Modules, Keithley Instruments
ComponentWorks, National Instruments
Unigen 200 Burn-in Systems, Motay ElectronicsMotay ElectronicsMotay Electronics
InterV3-Portable, DiagnoSYS Systems
ASL-1000, TMT
Odyssey, Nicolet Instrument Technologies
TDS 200 Series, Tektronix
Visual Science 1.0, Acroscience Corp.
RA/Plus, Teradyne
1997 Honorable Mentions
DL2700 Digital Storage Oscilloscope, Yokogawa Corp. of America
Model 160 Series Handheld Counters, Fluke
Model 1560 'Black Stack' Thermometer, Hart Scientific
GageLab Instrument Platform, Gage Applied Sciences
Matrox Genesis Real Time PCI Image Processor, Matrox Electronic Systems
Model 1269 VXI/VME Chassis, Racal Instruments
BLU300 Loader/Unloader System, Schlumberger
Pyramid Probe, Cascade Microtech
Serial Infrared (SIR) Tester, Genoa Technology
1996 Best in Test Winners
Sherlock, Sunrise Test Systems
Horizon 1500 harness tester, Cabletest International
Model 2000 digital multimeter, Keithley Instruments
PXL37 digital camera system, Photometrics
TekRanger TFS3031 mini-OTDR, Tektronix
Model 867 graphical multimeter, Fluke Corporation
9370 series digital oscilloscopes, LeCroy Corp.
EFA-1 & EFA-2 electromagnetic field analyzers, Wandel & Goltermann
CMD80 digital radio communications test set, Rohde & Schwarz/Tektronix
VM9000 VXI Modular Instrumentation Platform, VXI Technology
TekScope THS 720, Tektronix (Test Product of the Year)
1996 Honorable Mentions
J995 Memory Test System, Teradyne
DSP-EZ Programming Platform, Data Translation
Visual Test Extentions (VTX), Keithley MetraByte
System Two Audio Test System, Audio Precision
MXI-2 VXI Controllers, National Instruments
E2910A PCI Bus Exerciser, Hewlett-Packard
Scan EM-E and Scan EM-H EMI Proves, Credence Technologies
WT-110 Digital Power Analyzer, Yokogawa Corp. of America
HSP 4420 High-Speed Flying Prober, Integrated Solutions
Site Master 330 Cable and Antenna Analyzer, Wiltron
Model 400 of the Vega Series VLSI Testers, Megatest Corp.
Junction Xpress Vectorless Opens Test Tool, Genrad
Super Z Teradyne ATE Enhancement, Softlink
GT50-DIO Dynamic Digital I/O Card, Geotest
8801T Test Handler, Aetrium
PGA and BGA Contactors, Synergetix
1995 Best in Test Winners
DieMate, Texas Instruments & MicroModule Systems
Model 5300, North Atlantic Instruments
TDS 700A DSO, Tektronix
pQT ESD Generator, PicoQ Corp.
ChamberView, Cintek Automation Systems
CurrentSyntesis, CrossCheck Technology
FaxLab, Genoa Technology
OMS-200, Wandel & Goltermann
DASM-VIP, Analogic Corp.
HP 54620A, Hewlett-Packard (Test Product of the Year)
Scan ABT Test Access Logic, National Semiconductor
1995 Honorable Mentions
AT-MIO-16E-2, AT-MIO-16XE-50 Data Acquisition Boards, National Instruments
PCI-311, PCI-312 Plug-in Arbitrary Waveform Generator Cards, PC Instruments
Pay-Per-Use Option for HP 3070 Board Testers, Hewlett-Packard
LATEST, IBM
Virtual Test, Cadence
ASICTEST, Logic Vision
Testability Analyzer, Giordano Automation
BLU Board Loader/Unloader, Schlumberger
BoardRunner, AccuMate
LW420 Arbitrary Waveform Generator, LeCroy Corp.
AWG2005 Arbitrary Waveform Generator, Tektronix
VX1410 Chassis, Tektronix
1/2-Size Short Contact Test Sockets, Johnstech International
Multiscan/1200, IOtech
ABES Memkory Burn-in System, Micro Control Co.
1994 Best in Test Winners
VC-5430 Digital Oscilloscope, Hitachi DenshiAmerica
GTXI PC Instrument System Chassis, Geotest
PCMCIA-GPIB Interface Card, National Instruments
Safecracker Algorithmic Vector Generator, Teradyne
MCT 1149 VLSI/DFT Test System, Micro Component Technology
Mercury Environmental Test System, EJ Systems
Test Assistant, Compass Design Automation
9000 Multifunction Calibrator, Wavetek
TestJet, Hewlett-Packard (Test Product of the Year)
EMCO 3143 BiConiLog Antenna, Electro-Mechanics Company
TLS 216 Logic Scope, Tektronix
FIS-100 Flat Panel Inspection System, Photon Dynamics
Scopestation 140, LeCroy
1994 Honorable Mentions
J921 VLSI Test System, Teradyne
IDS P2X ProbePoint Extension, Schlumberger
Delta 100 VLSI Test System, LTX
AIDA II Design-for-Test Software, CrossCheck Technology
HP 75000 ATM Tester, Hewlett-Packard
Fluke 670 LANMeter, Fluke
ISR FFT Tools, Integrated Scientific Resources
Magnetic Force Microscope, Digital Instruments
3054 DSP Spectrum Analyzer, Tektronix
494 Solar-Charged DMM, Simpson Electric
IPA 310 Interconnect Parameter Analyzer, Tektronix
TCP-5 Thermocouple Test Probe, Everett Charles Technologies
1993 Best in Test Winners
HP 89410A/89440A Vector Signal Analyzers, Hewlett-Packard
Multimode Scanning Probe Microscope, Digital Instruments
Model 295 Arbitrary Waveform Generator, Wavetek Corp.
MegaLab/MegaLink, Knights Technology
MCT 6100 IC Test Handler, Micro Component Technology
GageScope Software, Gage Applied Sciences
LabView for Windows, National Instruments (Test Product of the Year)
VXI600 Programmable Power Suppy, Advanced Power Designs
ECAT Pulsed EMI Test System, Keytek Instrument Corp.
Dantes, Cadence Design Systems
BoardWatch 9000, Teradyne
FastScan/FlexTest, Mentor Graphics
1993 Honorable Mentions
HP Test Book, Hewlett-Packard
LogicMaster ATS4 IC Tester, Integrated Measurement Systems
Model DI-200 Data Acquisition Card, Dataq Instruments
CIR-1000 Screening System, Celect
Model 3001 GPX Logic Analyzer, Tektronix
Model E1350 Silicon Debug System, Advantest America
DCT-S Telecom Test System, ISDN Technologies Corp.
DaqBook/100 Data Acquisition System, IOtech
Model 2414A Arbitrary Wavefrom Generator, Pragmatic Instruments
ABES-III Automatic Burn-in & Environmental System, Micro Control Co.
J990 Series Memory Test Systems, Teradyne
SS30 Spring Contact Probe & Receptacle, Interconnect Devices
AFHT II-RT Automatic Dynamic Flying Height Tester, Pacific Precision Laboratories
Model 2784 Microwave Spectrum Analyzer, Tektronix
TDS 640 Oscilloscope, Tektronix
1992 Best in Test Winners
GR9000 Telecommunications Test and Measurement System, GenRad
CXI-3300 Inline Process Monitor, IRT Corp.
Model 2001 High-Performance DMM, Keithley Instruments
90 Series ScopeMeters, John Fluke Mfg. Co. Inc. (Test Product of the Year)
HF Video Microscope System, Optem International, a Divison of Amarel Precison Instruments
IDS 7000 FIBstation, Schlumberger Technologies, ATE Division
Sigma 2000 Scanning Electron Microscope, Amray Inc.
HP 71500A Microwave Transition Analyzer, Hewlett-Packard, Signal Analysis Division
Type 3538 Modular Test System, Bruel & Kjaer Test Systems
Hypersignal-Windows AMPS Version 1.10, Hyperception Inc.
Performance Enhancement Peripherals, GlobeTech International Inc.
Victory 2.0 Boundary Scan Software, Teradyne
1992 Honorable Mentions
Dummy Components, TopLine Components
VXIcpu-030 Embedded Computer, National Instruments
HP 8146A OTDR, Hewlett-Packard
9134L Long Memory Digital Storage Oscilloscope, LeCroy
Scan Educator, Texas Instruments
PRS-1000 Photoreflectance Spectrometer, Olympus Corp.
MicroZoom Probe Automated Microscope, Leica Inc.
DT3831 Series Anti-Aliasing Data Acquisition Boards, Data Translation Inc.
PR-650 SpectraColorimeter, Photo Research
M100 OptiTest Local Loss Test Set, Siecor Corp.
3504/3525 Backplane Tester, WEE Gmbh
Model 5000ds Double Sided Tester, Integri-Test Corp.
5790A Automated AC Measurement Standard, John Fluke Mfg. Co. Inc
Model 4065 Digital Cesium Frequency and Time Standard, Frequency & Time Systems
PM 6680 Timer/Counter, John Fluke Mfg. Co. Inc
LabWindows for DOS, Version 2.0, National Instruments
TDS 540 Digitalizing Oscilloscope, Tektronix
ATEasy Software, Geotest
Variables Value Monitor, Biomation
1991 Decade of Progress Winners
We began our awards program in 1991--our 10th anniversary. To commemorate our anniversary, we awarded the Decade of Progress Awards to 10 products that our editors felt had made significant advances in test technology during the previous decade.
The products selected were not necessarily the most successful of their type, either commercially or technically. They were, however, the first examples of technologies that changed test forever. In order to qualify for Decade of Progress consideration, the technical advance had to be significant enough to change the methods employed by test engineers in that particular part of the industry. Furthermore, the technology (though not necessarily the product) had to be successful enough to have attracted imitators.
First IBM PC-Based Instrument Board (1981), Techmar (now Scientific Solutions): Lab Master (Test Product of the Decade)
First PC-Instrument Control Software Package (1984), Adaptable Laboratory Software (became Keithley ASYST): ASYST
First X-Ray Microscope with a Microfocus Source (1982), Nicolet: Microx 2
First ICs Made for Board Testability (1985), Logical Solutions: LT74TC32/LT74TV32 Testability Circuits
First Combinational Board Tester (1981), Teradyne: L200
First CAD-Based E-Beam VLSI Diagnostic Workstation (1987), Schlumberger: IDS 5000
First Mixed-Signal Component Tester (1982), LTX: LTX77 with DX90 option
First Arbitrary Waveform Generator (1985), Data Precision (now Analogic): 2020 Waveform Synthesizer
First Tester-in-a-Head Device-Tester Architecture (1982), Micro-Component Technology: 2000 Series
First Direct EDA/ATE Software Link (1986), TSSI: TDS
1991 Honorable Mentions
MXI and MXI-based products (1989), National Instruments
Model 4094 Digital Oscilloscope (1982), Nicolet Test Instruments
ExperTest 2000 (1987), Array Analysis
CAF (Computer Automated Fixturing) (1986), In-Circuit Test
Video Measurement System/Vidicom Qualifier 863 (1981), Optical Gaging Products Inc.
TC01 Temperature Controller (1981), Sun Electronic Systems Inc.
Accelerator Liquid Burn-in System (1984), FTS Systems Inc.
HF-65 Microscope (1986), OPTEM International
Twister/HEP-25 (1989), Everett/Charles Contact Products Inc.
Coaxial Probe (1991), Interconnect Devices Inc.
5371A Modulation Domain Analyzers (1987), Hewlett-Packard, Santa Clara Division
HP Basic Products (1981), Hewlett-Packard
HP4145 Semiconductor Parameter Analyzer (1982), Hewlett-Packard, Japan
FiberScout (1991), Tektronix
3D SEM (1989), Leica
3DX Series 3000 (1991), Four Pi Systems
Data 6000 Waveform Analyzer (1982), Analogic Corporation (Data Precision)
HP8780A/HP8980A Vector Signal Generator/Modulation Analyzer (1987), Hewlett-Packard
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