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  • The Best in Test: 2006

    Test & Measurement World's technical editors have chosen the 2006 Best in Test award winners.

    Staff -- Test & Measurement World, 12/1/2005 2:00:00 AM

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    Also see:
    Honorable Mentions
    T&MW Awards Overview
    Dec. 2005/Jan. 2006 Features

    Each year, Test & Measurement World's editors present the Best in Test awards to products we think are particularly innovative or useful. Here, we present the 2006 Best in Test winners as well as 18 products worthy of honorable mention. T&MW's editors narrowed this year's field from scores of deserving products, nominated by vendors, that were introduced between November 1, 2004, and October 31, 2005.

    We invited our readers to help determine which of the 12 Best in Test products will become the Test Product of the Year by using an online ballot to cast their votes. Voting ended on January 18, 2006. We will announce the winning product in February and publish a description of it in our March 2006 issue.www.tmworld.com/product_showcase.

    In addition to the products described in this Best in Test section, keep in mind other worthy products identified by Test & Measurement World editors throughout the year in our Editors' Choice columns and Product Update features. You can read about these products at


    CLICK ON A PRODUCT NAME FOR THE COMPLETE DESCRIPTION.

    BOARD & SYSTEM TEST
    ScanFlex boundary-scan platform, Goepel Electronic

    SPECTRUM ANALYZER
    RSA3408A real-time spectrum analyzer, Tektronix

    X-RAY INSPECTION
    XStation MX and ClearVue inspection system, Teradyne

    DATA ACQUISITION
    PXI-5922 digitizer, National Instruments

    SEMICONDUCTOR ATE
    Sapphire D-10 test system, Credence Systems

    OSCILLOSCOPES
    DL9000 series oscilloscopes, Yokogawa

    RF & WIRELESS TEST
    ZVT 8 vector network analyzer, Rohde & Schwarz

    SOFTWARE
    Lab Manager 4.1 software, EdenTree Technologies

    POWER
    eLOAD series electronic loads, AMREL/American Reliance

    WIRELINE
    OBR reflectometer, Luna Technologies

    FAILURE ANALYSIS
    NC-1 noncontact probe system, Suss MicroTec Test Systems

    ELECTRONIC DESIGN AUTOMATION
    Encounter Test Architect software, Cadence Design Systems

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