Semicon West to feature Executive Test Summit
Advantest America, LTX-Credence, Teradyne, and Verigy leaders will participate.
-- Test & Measurement World, 7/10/2009 9:10:00 AM
The unprecedented economic challenges of today’s semiconductor industry are significantly pronounced in the test segment and will perhaps endure longer in test than other industry sectors. At the July 14 Semicon West Executive Test Summit, four industry leaders will discuss how these economic challenges threaten continued innovation, and they will comment on factors such as new business models, new customer-care and R&D strategies, and new approaches to precompetitive industry collaboration.
Participants will include R. Keith Lee, president and CEO of Advantest America; Dave Tacelli, president and CEO of LTX-Credence; Mark E. Jagiela, president of the semiconductor test division at Teradyne; and Keith Barnes, chairman, CEO, and president of Verigy.
Rick Nelson, editor-in-chief of Test & Measurement World and EDN, will moderate. He will encourage audience members to ask questions.
The Executive Test Summit is scheduled for 3:45 p.m. to 4:45 p.m. Tuesday, July 14, 2009, in the Test Assembly and Packaging TechXPOT stage in South Hall of the Moscone Center in San Francisco.
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Instead of an executive summit they should all start merger discussions
joseph r bronson - 2009-10-7 17:50:00 EDT
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