InFlip MEMS strip-test module
2007 Best in Test: MEMS TEST
By Staff -- Test & Measurement World, 12/1/2006 2:00:00 AM
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Awards overview Honorable mentions Online ballot 2007 Best in Test main page |
Multitest, www.multitest.com
A member of Multitest’s InMEMS product line, the InFlip MEMS strip-test module for three-axis low-g accelerometers incorporates a modular architecture designed to replace expensive custom-designed machinery. Convertible to support various MEMS applications and packages, the module can operate in a stand-alone mode in an engineering bench setup, or it can be configured with a Multitest InStrip platform for full automation.
The InFlip module can handle panels and lead frames ranging from 20x150 mm to 65x225 mm. It supports tests over the –40°C to +150°C temperature range. Access rotation velocity is approximately 180° per second. Index time is 0.5 s; strip exchange time is 9 s.
Go to the online ballot
2007 Best in Test Award Winners
DIGITAL MULTIMETERS
8846A digital multimeter, Fluke
AUDIO TEST
APx585 audio tester, Audio Precision
WAVEFORM GENERATORS
AWG7000 series arbitrary waveform generators, Tektronix
DATA-ACQUISITION
CompactDaq USB-based data-acquisition system, National Instruments
RF/MICROWAVE TEST
FSUP signal source analyzer, Rohde & Schwarz
OSCILLOSCOPES
Infiniium 80000B series oscilloscopes, Agilent Technologies
MEMS TEST
InFlip MEMS strip-test module, Multitest
PROBING SYSTEMS
M150 Measurement Platform, Cascade Microtech
AUTOMATED OPTICAL INSPECTION
OptiCon BasicLine 1M/4M AOI system, Goepel electronic
WIRELINE COMMUNICATIONS
Spirent Protocol Tester, Spirent Communications
BOARD TEST
TapCommunicator boundary-scan interface, JTAG Technologies
SEMICONDUCTOR TEST
Test Management Solutions software, OptimalTest
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