Electrical & Physical Environmental Test: 2009 Buyer's Guide
Use our updated buyer's guide to find the products you need.
-- Test & Measurement World, 7/1/2009 2:00:00 AM
Our 2009 Buyer's Guide contains more than 60 product and service categories, divided into five main sections with a total of 16 subsections. Each subsection includes hotlinked vendor names.
In this section:
EMC Test Environmental Test ESD Control and Protection
Return to the main 2009 Buyer's Guide page
Sampling of products from the past year
System tests automotive transient emissions
The AES 5500 EMC transient-emissions test system from Teseq lets you test automotive systems for conducted electrical transients. Designed for tests compliant with ISO 7637-2, the system consists of a mechanical switch, a line-stabilization network, an electronic switch, and a controller. The system lets you capture EUT (equipment under test) disturbances when you apply power. The EUT connects to the electronic switch, which lets the disturbance pass through to the EUT. You can capture the EUT’s response with an oscilloscope. The system handles battery current up to 100 A with a 1000-A inrush current for 10 ms or with a 300-A inrush current for 1 s. Teseq, www.teseq.com.
Vibration controller teams with dynamic signal analyzer
Configured with 4, 8, or 16 channels, the VibPilot from M+P International offers a portable solution for vibration testing and dynamic signal analysis. The system, which employs 24-bit sigma-delta ADCs (analog-to-digital converters) with simultaneous sampling rates of up to 102.4 kHz, enables alias-protected measurements in a frequency range of up to 40 kHz and a spurious-free dynamic range of more than 120 dB.
You can use the VibPilot, along with the VibControl and SO Analyzer software, to perform shaker testing that complies with ISO, DIN, MIL-STD 810, and other vibration-testing standards. It is suitable for general data acquisition and spectrum analysis, time-history recording, modal analysis, rotational dynamics, acoustic analysis, and vehicle pass-by-noise testing. M+P International, www.mpihome.com.
Test socket gets adjustable pressure pad
Aries Electronics now offers its 27-mm CSP/MicroBGA (chip-scale package/micro-ball-grid array) test and burn-in sockets with an optional adjustable pressure pad. With only a 0.010-in. (0.254-mm) displacement per revolution of the screw, this mechanism makes the sockets suitable for testing devices with large height tolerances as well as for testing devices that are small and fragile. Each adjustable pressure pad comes with a user-adjustable washer stack that serves as a hard stop to eliminate device over-compression. The CSP/MicroBGA family accommodates a variety of CSP, MicroBGA, DSP, LGA, SRAM, DRAM, and flash devices from 6.5 mm² to 55 mm². Operating temperature is –55°C to +150°C, and estimated contact life is a minimum of 500,000 cycles. Aries Electronics, www.arieselec.com.
RF shielded enclosure aids test of wireless devices
ETS-Lindgren’s Model 5247 RF shielded enclosure lets you measure transmitter power and receiver sensitivity on wireless devices at frequencies from 700 MHz to 6 GHz. You can use the chamber for precertification and production testing of cellphones, WiMAX devices, WiFi devices, Bluetooth devices, and other portable devices. Because the enclosure’s anechoic absorbers prevent reflected signals from interfering with wanted signals, you can use the enclosure to test your mobile device indoors.
The low end of the Model 5247’s frequency range will let you test devices in the 700-MHz band once reserved for UHF TV. The chamber provides more than 80 dB of RF isolation from outside interference. ETS-Lindgren, www.ets-lindgren.com.
| In this section: EMC Test Environmental Test ESD Control and Protection Return to the main 2009 Buyer's Guide page |
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