Autotestcon: Metrikos, Huntron offer near-field signature analysis
-- Test & Measurement World, 9/24/2007 8:05:00 AM
Metrikos, in conjunction with Huntron, demonstrated at Autotestcon its patent-pending near-field signature-analysis technology, which supports close proximity sensing of EM fields emanating from active or passive circuitry.
The technology is based on the observation that identical printed-circuit boards will emanate nearly identical fields as a function of an RF sensing probe’s position relative to each board. The Metrikos approach makes use of robotic RF probe positioning to determine a board’s near-field signature as a function of x, y, and z coordinates.
Metrikos calls each probe position a Virtual Test Point, whose value can be stored for subsequent recall and comparison. Anomalies—such as an open trace, short, or bad component—alter Virtual Test Point values, and a comparison of a board under test’s signature with that of a known good board isolates faults—even on conformally coated boards.
A near-field test system includes PXI instrumentation and a Huntron Access Prober platform, which positions a Metrikos NFSA sensor at programmable x, y, and z locations over a circuit under test. Huntron distributes the systems.
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