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  • Vote for the Best in Test 2009

    Our editors have selected the finalists for the Best in Test awards.

    -- Test & Measurement World, 12/1/2008 2:00:00 AM



    Awards overview
    Voting deadline: February 6, 2009

    We have also selected six finalists for the Test of Time award, which honors a product that continues to provide state-of-the-art service five years or more after its introduction. Help us choose the 2009 Test of Time winner by casting your vote for the finalist of your choice. The Test of Time winner will also be announced April 1. (Go here to read about the Test of Time finalists.) 



    2009 Best in Test Finalists

    Audio/video and multimedia

    → IxRave Service Validation Platform, Ixia
    → Multimedia Test System, VI Technology
    → PEVQ Analyzer, OPTICOM
    → WaveQoE Test Suite, VeriWave

    Read more about them

    Oscilloscopes

    → DLM2000, Yokogawa
    → DPO3000, Tektronix
    → InfiniiVision 7000 Series, Agilent Technologies
    → M-Class, ZTEC Instruments
    → PicoScope 9201, Pico Technology
    → WavePro 7 Zi Series, LeCroy Corporation

    Read more about them
      

    Board and system test and configuration

    → Cover-Extend Technology, Agilent Technologies
    → Flashstream Flash Vector Programming System, BPM Microsystems
    → Flying Scorpion FLS900 Dx Flying Probe System, Acculogic
    → SigmaSure Process Flow Visualization Software, SigmaQuest
    → TS-375 Avionics Test Platform, Geotest—Marvin Test Systems

    Read more about them
      

    Protocol analyzers

    → IxYukon Load Module, Ixia
    → N5309A-COM Compliance Assured Test Package, Agilent Technologies
    → TestCenter 3000 Series Module, Spirent Communications
    → Xgig FCoE Test Platform, Finisar

    Read more about them
      

    Boundary Scan

    → JT 37x7 Rack-Mountable Instrument, JTAG Technologies
    → onTAP Series 4000 Software Featuring ProScan, Flynn Systems
    → Remote Instrumentation Controller, Model 1000 (RIC-1000), ASSET InterTech
    → ScanBox RM System, Acculogic
    → UltraTAP-BT Test Pod, Intellitech
    → VarioTAP Platform, GOEPEL electronic

    Read more about them
      

    RF/microwave instruments: Application/standard specific

    → 3500A Portable Radio Communications Test Set, Aeroflex
    → BTS Master and Spectrum Master Analyzers, Anritsu Company
    → DigRF V4 Exerciser/Analyzer, Agilent Technologies
    → IQultra UWB Test System, LitePoint
    → URT Record & Playback System 4.0, Averna

    Read more about them

      

    Data acquisition

    → DAC5682Z Digital-to-Analog Converters, Texas Instruments
    → DNR-12-1G Ethernet I/O Rack, United Electronic Industries
    → TEMPpoint Temperature Measurement Instrument for Ethernet (LXI), Data Translation
    → USB-1616HS-BNC Multifunction Data Acquisition Device, Measurement Computing
    → Wi-Fi Data Acquisition Devices, National Instruments

    Read more about them
      

    RF/microwave instruments: General purpose

    → 6.6 GHz PXI Express RF Modular Instruments, National Instruments
    → GT-1000A Microwave Power Amplifier, Giga-tronics
    → Model 1830A RF Power Meter, TEGAM
    → R&S FSV Signal and Spectrum Analyzer, Rohde & Schwarz
    → SA2600 Handheld Real-Time Spectrum Analyzer, Tektronix

    Read more about them

    EDA/DFx/Test data-analysis software

    → DFT MAX compression solution, Synopsys
    → Encounter True-Time ATPG, Cadence Design Systems
    → Global Test Operations Solution, OptimalTest
    → Solder Joint Built-In Self-Test Software, Ridgetop Group

    Read more about them

    Semiconductor test

    → Automated Contact Resistance Socket Tester (CR-2600), Antares Advanced Test Technologies
    → EDGE Flicker Noise Measurement System, Cascade Microtech
    → MT2168 Pick and Place Service, Multitest elektronische Systeme
    → Protocol Aware Test System, Konrad
    → Turnkey RF Test Cell, Advantest
    → UltraWave 12G Test Instrument, Teradyne

    Read more about them
      

    General-purpose instruments (non-oscilloscopes)

    → 287 True-rms Electronics Logging Multimeter, Fluke
    → 86108A Precision Waveform Analyzer, Agilent Technologies
    → DPP12500A-4T 12.5 Gbps 4 Tap Digital Pre-emphasis Processor, Synthesys Research
    → NSG 3060 Immunity Pulse Testing System, Teseq
    → Precision Resistor Module Family, Pickering Interfaces
    → U1253A Handheld Digital Multimeter with OLED Display, Agilent Technologies

    Read more about them
      

    Test accessories and interconnects

    → Edge 400a Series Contactors, Johnstech International
    → Gemini Kelvin Spring Pins, Everett Charles
    → Lead Free Test Probes, Interconnect Devices
    → Synergetix Dyno Test Socket for QFN Devices, Interconnect Devices
    → Ultra High Density (UHD) Interconnect Builder, W.L. Gore & Associates
    → W2630A Series DDR2 and DDR3 BGA Probes, Agilent Technologies

    Read more about them

    Machine vision and inspection

    → sprint Color Cameras, Basler Vision Technologies
    → Genie GigE Vision-compliant Cameras, DALSA
    → In-Motion Measurement for WYKO 9000 Optical Profilers, Veeco Instruments
    → MV-7L In-line AOI System, MIRTEC
    → OptiCon TurboLine AOI System, GOEPEL electronic

    Read more about them
      

    Test-development and test-management software

    → Arendar 2009 Suite, VI Technology
    → Simics 4.0, Virtutech
    → TestShell 2.2, QualiSystems
    → UPC Manager, Pacific Power Source
    → VEE Pro 9.0, Agilent Technologies

    Read more about them

    Network physical-layer test

    → 100GbE Development Accelerator System, Ixia
    → AXS-635 Triple-Play Test Set, EXFO
    → MW90010A Coherent OTDR, Anritsu Company
    → Precision Reflectometer 4400, Luna Technologies

    Read more about them



    Also:
    Read about the finalists for the 2009 Test of Time award
    Read more about our awards program and about past winners
    Read our entire December/January issue
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