Integrated T2000LS/M4841 SOC Test Cell
2008 Best in Test: SEMICONDUCTOR TEST
Staff -- Test & Measurement World, 12/1/2007 2:00:00 AM
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Advantest , www.advantest.com
Advantest’s Integrated High Performance T2000LS Mainframe/M4841 Dynamic Test Handler SOC Test Cell Solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.
The OpenStar-compliant and liquid-cooled T2000LS is compact yet flexible enough to test various system-on-chip (SOC) devices. Its 26-slot test head accommodates the instrument modules necessary to test RF, audio, baseband, and data-conversion functions; in addition, the T2000LS can support more than 2000 digital pins.
The M4841 handles a range of packages. It employs technological innovations such as Advantest’s Soft Touch handling feature, which uses an electro-pneumatic air-pressure technique to avoid damaging extremely miniaturized parts during touchdown.
| ♦ Online ballot ♦ Honorable mentions ♦ Awards overview ♦ 2008 Best in Test main page |
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| Deadline for voting: February 15, 2008 |
2008 Best in Test Award Winners
MULTIMETER
8808A Digital Multimeter, Fluke
VIDEO TEST
Q-400 IPTV Probe, Symmetricom
MILITARY AND AEROSPACE TEST
SMART^E Synthetic Test Environment, Aeroflex
SEMICONDUCTOR TEST
Integrated T2000LS/M4841 SOC Test Cell, Advantest
BOUNDARY SCAN
ScanAssist, Goepel Electronic
ELECTRONIC DESIGN AUTOMATION
Encounter Test Architect GXL, Cadence Design Systems
SOFTWARE
iTest Team, The Fanfare Group
OSCILLOSCOPE
DSA70000, Tektronix
PC-BASED INSTRUMENT
PicoScope 5204 PC Oscilloscope, Pico Technologies
MACHINE VISION
Falcon 1.4M100 Area Camera, Dalsa
POWER TEST
N6705A DC Power Analyzer, Agilent Technologies
RF/WIRELESS TEST
CMW270 WiMAX Tester, Rohde & Schwarz
| Go to the online ballot. |
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