Verigy accelerates yield learning on V93000 test platform
The Yield Learning Solution consists of the V93000 scalable test platform plus the Triage Fault Locator and YieldVision software toolsets.
By Rick Nelson, Editor-in-Chief -- Test & Measurement World, 6/24/2009 8:44:00 AM
Verigy has introduced its Yield Learning Solution, which integrates on-tester, real-time capture and analysis of electrical failures on complex system-on-chip (SOC) devices. The Verigy Yield Learning Solution offers a combination of pre-analysis modules on the Verigy V93000 SOC test platform, including a design-centric analysis and visualization toolset.
Specifically, the Yield Learning Solution consists of the V93000 scalable test platform plus the Triage Fault Locator and YieldVision software toolsets for failure-data capture and yield analysis. Triage provides on-tester fault localization and includes an on-tester sampling engine; YieldVision supports offline data analysis.
The scalable architecture of the V93000 allows for complete integration with the Yield Learning Solution. The Triage software’s proprietary algorithms enable efficient data processing, and the YieldVision analysis and visualization tools reduce the time required to diagnose problems. By seamlessly linking electrical test with physical layout data, the tools allow fast localization of the root cause physical defects.
Diagnosing problems in nanometer level device design and manufacture is becoming more challenging, which makes closing the loop between design, fab, and test essential, says Colin Ritchie, VP of marketing for DFX solutions at Verigy, adding that Verigy’s Yield Learning Solution addresses the design/fab matching that is essential for a successful business. He noted that design-for-manufacturability problems, which can result from litho-unfriendly design or failure to adequately follow increasingly restrictive design rules. The inability to quickly isolate and fix such problems, he says, can lead to billions of dollars in lost annual revenue, citing VLSI Research figures.
Ritchie notes that traditional approaches to yield diagnosis can require many days to identify design problems that lead to yield loss—such iterative approaches often require retest of failed devices plus a sequence of fault-simulation and layout extraction to physically locate faults. Not only is the process time-consuming—it can generate terabytes of data. In contrast, says Ritchie, Verigy’s on-tester approach generates only kilobytes of data and delivers results in minutes.
The Yield Learning Solution efficiently links test back into both design and the fab, providing logic bitmaps for both stuck-at and difficult-to-detect timing faults in scan chains and logic. The Yield Learning Solution provides both the accuracy required for the lab and the high throughput needed for production—critical for both new product introduction and ongoing manufacturing monitoring. Ritchie says that Triage can perform on-tester localization of blocked scan chains and hold-time faults while performing on-tester characterization, generating “a shmooo at every flop.” YieldVision, he says, “speaks the language of the designer and the language of the fab,” providing diagnosis at the wafer, die, and component level.
Ritchie cited customer results indicating a four-week acceleration in time to market, an increase in entitlement yield of up to 6%, and a ten-fold reduction in the number of wavers required to reach entitlement yield.
Larry Dibattista, GM of DfX Solutions at Verigy, said, “Because of the tremendous investment in resources associated with designing at 45-nm and below, our customers need a solution that enables them to collaborate with their foundry, whether in-house or outsourced, to quickly diagnose their defects using secure IP-protected information.” He added, “Verigy’s Yield Learning Solution not only facilitates this efficient collaboration, but also characterizes these design problems, providing semiconductor manufacturers with a unique capability to respond to and correct yield excursions in real-time which in turn accelerates time-to-market.”
Verigy will showcase the Yield Learning Solution will be showcased at Semicon West.
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