Photodiode test system
Staff -- Test & Measurement World, 6/1/2004 2:00:00 AM
The Model 280 test system characterizes the parametric performance of PIN and avalanche photodiodes in both R&D and production settings. A complete characterization, including responsivity and polarization dependency over wavelength, takes less than 8 s. The 280 performs all-state, as well as the faster, more accurate four-state and six-state, polarization dependent responsivity (PDR) measurement. Measurement noise is below 200 fA, allowing for very accurate dark current characterization. dBm Optics, Boulder, CO. 303-464-1919;www.dbmoptics.com.
Talkback
No related content found.
- 0 rated items found.
Datasheets.com Electronic Parts & Inventory Search
185 million searchable parts
- Part Number
- Description
- Inventory
- Products
- Manufacturers
Sponsored Links
View All Webcasts
