News Briefs
-- Test & Measurement World, 3/1/2009 2:00:00 AM
Agilent, Anite demonstrate LTE end-to-end streaming video
Agilent Technologies and Anite teamed up to demonstrate 3GPP LTE interoperability at the Mobile World Congress (February 16–19, Barcelona, Spain). The demonstration showed end-to-end streaming video with a Blue Wonder UE chipset, a Signalion SORBAS LTE UE (user equipment) simulator, an Agilent E6620A LTE wireless-communications test set, and an Anite SAT LTE protocol-development toolset.
The demonstration results from a strategic partnership between Agilent and Anite to deliver LTE UE development tools to wireless engineers. Said Paul Beaver, business unit director at Anite, “Our partnership with Agilent plays a pivotal role in pioneering the LTE ecosystem.” Niels Faché, VP and GM of Agilent’s mobile broadband division, added that the partnership addresses the early testing needs of LTE UE developers.
As a key component of the LTE streaming-video demonstration, Agilent’s E6620A wireless communications test set provides a common hardware platform, integrating a 3GPP release-8-compliant protocol stack (jointly developed with Anite). Helping to shorten design cycles, it offers real-time, system-rate network emulation for L1/L2/L3 uplink and downlink via RF or digital baseband. Anite’s SAT LTE protocol-development toolset (commercially shipping on the E6620A platform) provides a suite of development tools for UE designers. www.agilent.com; www.anite.com; www.bluwo.com; www.signalion.com.
Aeroflex accelerates rollout of features for LTE handset tester
Aeroflex has announced that it will accelerate the rollout of the new features planned for 2009 for its 7100 digital radio test set for LTE mobile device test. “LTE is fast becoming a global phenomenon with network operators in all the current CDMA-dominated markets (US and Asia) in addition to the traditional GSM markets increasingly opting for LTE for their next-generation mobile broadband networks,” said Bill Burrows, business development manager at Aeroflex Test Solutions. “The decision to accelerate our new feature roadmap for the Aeroflex 7100 is designed to support their similarly aggressive rollout plans and the demanding test requirements this places on developers designing new chipsets, protocol stacks, and devices supporting the LTE standard.”
The accelerated rollout of new features for the Aeroflex 7100 during 2009 relates to LTE/CDMA2000 interworking, LTE UTRAN (UMTS Terrestrial Radio Access Network) and GERAN (GSM Edge Radio Access Network) handover, TD-LTE mode (referring to the time-domain duplex version of LTE, which China is adopting), and LTE mobile device conformance test.
“Our accelerated product roadmap for the Aeroflex 7100 will ensure that, throughout 2009, it will progressively incorporate all the additional features and functionality needed to meet the aggressive rollout plans announced by the major network operators, device developers, and standards organizations pushing the introduction of LTE as the next-generation mobile broadband networks,” concluded Phil Medd, product manager for the Aeroflex 7100 LTE handset tester. www.aeroflex.com.
Multitest sells MEMS test module for magnetic resistance applications
Multitest announced it has recently received an order from an international IDM for a MEMS module for a magnetic-resistance applications in the automotive industry. The decision was driven by efforts to bring down the cost of test, Multitest said.
The module will run in conjunction with the MT99xx, Multitest’s kitable high-speed gravity handler, which is octal-site qualified. In addition, an OCR (optical character recognition) reader integrated in the contact cassette of the MT99xx will enable the customer to correlate the test results with various test settings. The customer also will be able to convert its MT99xx to accommodate different MEMS package styles. www.multitest.com.
Lithium-ion-cell measurement instruments
Data Translation has announced its VOLTpoint series of voltage-measurement instruments for lithium-ion cell-by-cell determination. Each VOLTpoint is a stand-alone box offering 48 separate 24-bit-resolution inputs over a sampling range of ±100 V, each with its own sigma-delta ADC for direct connection to a PC via USB or Ethernet (the Ethernet version is LXI-compatible).
The instruments can make high-voltage, precision battery-stack and cell-balance measurements in commercial and military hybrid-vehicle applications. They accept direct voltage inputs of any value in the range of ±100 V from a single cell or from a series of stacked cells. In addition, the instruments can make motor shunt measurements. Each of 48 separate input channels offers 1000-V channel-to-channel galvanic isolation. Maximum error for any input range is 3 mV.
The instrument comes with the software necessary to enable out-of-the-box measurements. The vendor offers software supporting the VOLTpoint, including IVI-COM drivers, .NET class libraries, and software development kits.
Prices: DT9873 for USB—$7995; DT8873 for Ethernet (LXI)—$8495. Data Translation, www.datatranslation.com.
Add errors to the PCI bus
Agilent’s N5323A PCIe (PCI Express) jammer lets you test a peripheral card, PC motherboard, or PCIe interface device by injecting errors onto the bus. The jammer, a card that inserts between a motherboard and a peripheral, is completely transparent to both. Because it’s transparent, the jammer will work with any operating system running on the motherboard. With the jammer, you can inject errors at the physical layer, data-link layer, and transaction layer.
Physical errors include disparity error, drop of TLP (transaction-layer packet) start and end characters, and link retraining. Data-link errors include dropping or inserting of DLLP (data-link layer packets) and sending corrupt CRC (cyclic redundancy check) values. Transaction-layer errors include dropping, delaying, replacing, or modifying TLP packets.
The PCIe jammer lets you perform tests through a user interface with software that communicates to the card over USB. Using the Windows-based software, you can perform predefined test cases on your peripheral or motherboard. It also provides a Tcl application programming interface, which lets you automate tests by writing scripts. The jammer is available in three lane versions: x1, x4, and x8.
Base price: $27,500. Agilent Technologies, www.agilent.com/find/pciejammer.
Calendar
SAE World Congress, April 20–23, Detroit, MI. SAE. www.sae.org.
International Reliability Physics Symposium (IRPS), April 26–30, Montreal, QC, Canada. IEEE Reliability Society. www.irps.org.
ESTECH, May 4–7, Schaumburg, IL. Institute of Environmental Sciences and Technology. www.iest.org/estech/estech.htm.
International Microwave Symposium, June 7–12, Boston, MA. IEEE Microwave Theory and Techniques Society. www.ims2009.org.
To learn about other conferences, courses, and calls for papers, visit www.tmworld.com/events.
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