Show Highlights: Vision 2004; International Test Conference 2004
Staff -- Test & Measurement World, 12/1/2004 2:00:00 AM
Vision products serve electronic, automotive, and robotic applications
Vision 2004, October 19–21, Stuttgart, Germany,www.messe-stuttgart.de.
| International Test Conference |
Vision 2004 hosted more than 182 exhibitors representing 20 countries, with 39% of the exhibitors coming from outside Germany. Many displayed a variety of machine-vision and inspection systems and components for electronic, automotive, and robotic applications.
Coreco Imaging (www.imaging.com) highlighted two image-acquisition boards: its new X64-CL iPro dual-image model and its X64-AN Quad, which interfaces with up to four independent analog cameras. . . .National Instruments (www.ni.com) introduced the PCI Express-based NI PCIe-1429 image-acquisition board, which includes two Camera Link connectors and supports base-, medium-, and full-configuration Camera Link cameras, including Redlake's MegaPlus II models.
Redlake (www.redlake.com) demonstrated its MotionXtra HG-TH high-speed multihead camera system for automotive testing and other applications; its MotionPro HS Series cameras, which support USB 2.0 and are compatible with LabView and Matlab plug-ins; and its MegaPlus II cameras for applications including wire bonding and flat-panel-display applications. . . .MVTec Software (www.mvtec.com) highlighted Release 3.0 of its ActivVisionTools software, which supports multiple images from frame grabbers and directly connected cameras. The software supports an ActiveX user interface that enables users to grab and process images from multiple sources interactively and instantly.
Matrix Vision (www.matrix-vision.de). highlighted cameras including its new mvBlueFOX, an industrial camera with a high-speed USB interface in a compact case. . . .Dalsa (www.dalsa.com) described its camera offerings, including the Spyder2 line-scan camera with Camera Link interface. . . .Sony Europe's Image Sensing Solutions division (www.sony.com) demonstrated a pre-release version of its XCD-V50 camera, which captures full-resolution VGA images at 60 frames/s.
Basler Vision Technologies (www.basler-vc.com) introduced three new cameras: the 3-line-by-4080-pixel L304kc color line-scan camera, the A622f 1.3-Mpixel area camera (which incorporates an IEEE 1394 interface and provides up to 24 frames/s), and the A40k, a 4-Mpixel, 96-frames/s area-scan camera. . . .Allied Vision Technologies (www.alliedvisiontec.com) highlighted its FireWire cameras, including the 12-bit 3288x2470-pixel Oscar F-810C.
Pleora Technologies (www.pleora.com) described its Gigabit Ethernet connectivity offerings for machine-vision applications. . . .Euresys (www.euresys.com) was on hand to describe its vision boards and image-processing software.
ATE, EDA vendors exhibit wares
International Test Conference, October 26–28, Charlotte, NC,www.itctestweek.org.
Advantest (www.advantest.com) displayed its T2000 platform, which conforms to the Semiconductor Test Consortium's (www.semitest.org) OpenStar platform. . . .Roos Instruments (www.roos.com) described test systems for RF devices, highlighting the OpenStar-compliant Cassini tester for RFIC multisite and RF strip-test applications. . . .Eagle Test Systems (www.eagletest.com) exhibited low-cost mixed-signal and RF test systems.
Teseda (www.teseda.com) demonstrated DFT-focused systems and software that serve as engineering debug tools that can exchange data with EDA systems. . . .GuideTech (www.guidetech.com) introduced its GT4000 Continuous TIA precision timing analyzer, which adds 3.2-Gbps test capabilities to allow lower-speed ATE systems to measure jitter on high-speed serial interfaces. . . .Wavecrest (www.wavecrest.com) demonstrated the SIA signal-integrity-analysis systems, which address the PCI Express 1.1 spec.
Although not exhibiting, an Inovys (www.inovys.com) spokesperson was on hand to describe a new zero-footprint Ocelot structural tester that mates directly to a prober. . . .Magma Design Automation (www.magma-da.com) previewed the "Physically Aware DFT" capabilities of its RTL-to-GDS II system. . . .Synopsys (www.synopsys.com) highlighted its Galaxy test flow. . . .Mentor Graphics (www.mentor.com) described enhancements to the MBISTArchitect tool and described automated functionality for the FastScan and TestKompress tools.
Cadence Design Systems (www.cadence.com) highlighted its Encounter Test offerings. . . .SynTest (www.syntest.com) debuted ATPG starter packages. . . .Asset InterTech (www.asset-intertech.com) and Corelis (www.corelis.com ) highlighted support for the IEEE 1149.6 standard for AC-coupled nets. . . .JTAG Technologies (www.jtag.com) described support for in-circuit testers. . . . Acculogic (www.acculogic.com), Intellitech (www.intellitech.com), and Goepel Electronic (www.goepel.com) were on hand to describe a licensing agreement, a parallel 1149.1 approach, and recently introduced enhancements, respectively.
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