Semicon West: Advantest demonstrates integrated test cell
-- Test & Measurement World, 7/24/2007 5:08:00 AM
Advantest at Semicon West last week demonstrated its new hardware and software test cell for a range of complex consumer devices. Advantest, which designs and manufactures its own handlers and interfaces in addition to its test systems and software, said the new test cell brings highly parallel, high-performance turn-key testing capabilities to SOC consumer device manufacturing.
Advantest’s new SOC test cell supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 UPH. It is OpenStar-compliant.
Specifically at Semicon, Advantest demonstrated its new T2000 LS mainframe (T2000LSMF) linked to its new M4841 dynamic test handler, running together with two new applications modules, an 800MDM and a 32-channel PMU.
The 800MDM module provides up to 128 channels per module (up to 6000 channels per system) the 800MDM module provides special hardware features focused on speedy testing of source-synchronous interfaces. It supports scan test, memory test, and multiple time domains.
The PMU32 provides the analog complement to the 800MDM, offering high channel density and high performance on a single test system module. In addition to traditional DC measurements, this module tests ADCs and DACs. It also offers fine low-level resolution of down to 25 microvolts as well as a voltage range of up to +40V.
Advantest’s M4841 Dynamic Handler is a high-throughput handler for volume testing consumer devices such as MCUs and DSPs, and supports complex ICs and their advanced packaging technologies, including BGA, CSP, and QFP.
Capable of parallel testing up to16 devices, the M4841 doubles the capability of Advantest’s M4841 handler. It employs Advantest’s Soft Touch handling using electro-pneumatic air pressure to avoid damaging extremely miniaturized parts during touchdowns. In addition to high test parallelism, the modular design of M4841 handler provides options for parallelism, temperature range, and device processing capacity.
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