Cognex unveils In-Sight software
Staff -- Test & Measurement World, 8/1/2006 2:00:00 AM
During Semicon West (July 11–13, San Francisco, CA), Cognex highlighted its In-Sight Explorer network automation software, which includes tools to manage a system of networked In-Sight wafer readers. The software provides controls for remote setup of wafer readers, for managing access-level permissions, and for handling network, I/O, system backup and restore, and other system-management tasks.
In addition, the company announced that the In-Sight 1721 wafer reader now includes a Microsoft .NET-based graphical user interface that provides the look and feel of the company's 1700 Series models. The 1721 can be retrofitted into existing equipment.
"With In-Sight Explorer software, virtually every task is easier," said Justin Testa, Cognex senior VP for ID products. "As our fab customers continue to move toward fully automated wafer traceability, these new tools will make it easier for them to achieve higher yields by centralizing control of multiple wafer readers on the fab network." www.cognex.com.
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