Highlights
-- Test & Measurement World, 5/1/2009 2:00:00 AM
PXI system performs WLAN tests
National Instruments has introduced a WLAN test system that the company says can generate and analyze RF signal measurements four times faster than other modular systems and up to 10 times faster than traditional box instruments. The system combines NI’s new WLAN Measurement Suite software with its 6.6-GHz PXI Express RF hardware, enabling engineers to test for compliance with IEEE 802.11a/b/g. NI says the software-defined system can also be reconfigured for GPS, WiMAX, Bluetooth, and RFID testing.
The WLAN Measurement Suite comprises NI’s WLAN Generation Toolkit and WLAN Analysis Toolkit for LabView and LabWindows/CVI. The PXI Express hardware consists of a 6.6-GHz vector signal analyzer (NI PXIe-5663), a 6.6-GHz vector signal generator (NI PXIe-5673), an 18-slot chassis (NI PXIe-1075), and a dual-core controller (NI PXIe-8106). Engineers can generate 802.11a/b/g signals with data rates from 1 Mbps to 54 Mbps with the WLAN Generation Toolkit. Using the WLAN Analysis Toolkit, engineers can perform PHY layer measurements such as power, EVM (error vector magnitude), and spectrum mask margin. www.ni.com.
Pickering unveils two PXI chassis
The 40-922 (eight-slot; pictured) and the 40-923 (19-slot) PXI chassis from Pickering Interfaces provide support for a three-slot embedded controller or a PCI-to-PXI interface. Pickering says that the use of a temperature-controlled variable speed fan gives each chassis a high cooling capacity with low acoustic noise.
An intelligent chassis-management system monitors power-supply voltages, internal operating temperatures, and fan-speed status. Optional rack-mounting kits ensure the chassis can be quickly mounted into rack systems. The 40-923 permits the use of an external 10-MHz clock, enabling instrumentation in the chassis to be easily frequency-synchronized to other instruments in an ATE system. www.pickeringtest.com.
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