Cascade Microtech addresses power semiconductors and RFICs
-- Test & Measurement World, 8/1/2009 2:00:00 AM
Cascade Microtech is addressing the emerging energy-efficiency standards that are driving the need for accurate power-device characterization in automotive, mobile-device, transportation, and other applications. In addition, the company is targeting probing for millimeter-wave RFICs that will serve applications operating in the 60- to 80-GHz range.
To address power-characterization needs, the company has introduced a set of new probes and accessories for its Tesla on-wafer power-device characterization system, making Tesla fully compatible with the recently released Agilent Technologies’ B1505A power-device analyzer. The combined system offers an extended triaxial measurement range to accommodate low-noise probing of power devices up to 2000 V.
The Tesla system meets these demands for making measurements at increasing voltage and current levels when characterizing devices fabricated using new wide-band-gap materials such as SiC and GaN. Tesla offers what the company says is the industry’s highest voltage and current range for on-wafer measurements: up to 2000 V triax or 3000 V coax, and up to 60 A pulsed or 20 A continuous.
Cascade has also released two products that streamline engineering and production testing of high-bandwidth, short-range RFIC devices for WirelessHD, automotive radar, and other 60-GHz wireless applications. Using a combination of Cascade Microtech’s thin-film technology and coaxial probe technology from its Infinity Probe architecture, the 110-GHz Unity-MW millimeter-wave RFIC engineering probe (pictured) supports the precision characterization and testing of these multiple-port emerging technologies. Using the same membrane technology, the Pyramid-MW 81-GHz production probe card supports the at-speed test of known-good-die in high volumes. Cascade Microtech, www.cascademicrotech.com.
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