IEEE names Rytting for Joseph F. Keithley Award
-- Test & Measurement World, 6/4/2007 11:01:00 AM
The IEEE has selected Douglas K. Rytting as the recipient of its 2007 Joseph F. Keithley Award in Instrumentation and Measurement, recognizing his seminal technical and leadership contributions to microwave network analyzer technology. Presented at this year's IEEE/MTT-S International Microwave Symposium, the award is sponsored by Keithley Instruments and recognizes outstanding contributions in electrical measurements.
Rytting has been involved with virtually all Hewlett-Packard and Agilent Technologies microwave network analyzers introduced since he joined HP in 1966. He led the development of error correction methods, accuracy analysis, nonlinear measurements, and general measurement techniques in the microwave industry, all of which revolutionized measurements for microwave network analysis. In addition, Rytting introduced new concepts and algorithms that form the basis for many modern microwave network analyzer calibrations.
Rytting's earliest designs were in the first network analyzers introduced by Hewlett-Packard in the 1960s. Later, he managed the development of automatic network analyzers, RF network analyzers, and microwave network analyzers and helped launch HP's Microwave CAE Design Software. He helped support the architecture design of HP's microwave performance network analyzer family and developed new measurement methods, instrument and system block diagrams, and error correction techniques in the microwave industry for Agilent.
Retired from HP/Agilent Technologies, Rytting is now consulting on microwave measurements and calibration techniques at Rytting Consulting, Santa Rosa, CA.
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