JTAG Technologies debuts boundary-scan I/O module
-- Test & Measurement World, 12/1/2008 2:00:00 AM
The compact JT 2149/MPV DIOS (digital I/O scan) module provides test access to printed-circuit boards requiring external I/O stimulus and response monitoring.
The MPV (multi-programmable/multi-voltage) DIOS plugs directly into JTAG Technologies’ QuadPOD, the standard front-end of the Data-Blaster series of boundary-scan JTAG controllers. When connected to a circuit board via edge connector or fixture test pins, the module exercises the board’s connections in synchronization with the boundary-scan infrastructure. The DIOS module supports the vendor’s new SCIL (Scan Configurable Interface Logic) technology to allow custom functions such as pattern generators, counters, and bus simulators to be factory formatted for advanced functional and pattern-oriented testing. SCIL supports at-functional-speed testing of non-boundary-scan logic clusters, which can also be tested using static patterns.
While the module occupies one of the TAP locations in the QuadPOD, the system still provides four independent TAPs to the unit under test by means of a stream-through function. The DIOS module is backward compatible with other JTAG I/O scan systems, and both output and input thresholds can be programmed.
The I/O channels are grouped into blocks of 16 channels. Selected channels can be interfaced with custom cabling to the board under test for low-volume applications or interfaced with bed-of-nails fixtures for higher volume production. The I/O channels are individually programmable as input, output, bidirectional, or tristate signals.
Price: $1250. JTAG Technologies, www.jtag.com.
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