Credence debuts high-density instrument for Diamond testers
-- Test & Measurement World, 5/1/2008 2:00:00 AM
Credence Systems has introduced the DD1096-32 digital instrument with 32-Mbit deep reconfigurable parallel vector memory for use with the company’s Diamond IC testers. Using the 96-channel DD1096-32 within the 10-slot Diamond 10 offers customers up to 768 channels, each with 32 Mbits of parallel vector-memory depth. The DD1096-32 also enables up to 256 scan chains and more than 77 billion scan vectors. For massive multisite use in high-mix, high-volume production applications, the 40-slot Diamond 40 with the DD1096-32 scales up to 3072 channels with up to 1024 scan chains and more than 309 G scan vectors. This scan capability is configurable from narrow to wide “broadside” scan for efficient test coverage.
The instrument’s 100-MHz pattern sequencer can provide 200-MHz clocks and drive data rates up to 200 Mbps. The DD1096-32 comes with a flexible instruction set to support conventional functional tests, along with STIL-based EDA integration for applying structural test methods. It can handle any combination of input or output chains such as those required for BIST-enabled devices. Moreover, a two-bits per scan-output-cycle capability allows masking of failing scan cells to improve customers’ debug productivity. Other features include algorithmic pattern generation for development and debug of embedded memory tests, field-upgradeable firmware, integrated time-measurement capability, high-speed scalable data transport, flexible point-to-point triggering, and pattern-speed synchronization with other instruments in the system.
Base price: less than $600/pin. Credence Systems, www.credence.com.
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