Verigy introduces redundancy analysis option for its V6000 WS memory test system
The scalable SmartRA allows manufacturers to meet the expanding fail-storage and performance requirements of redundancy analysis for DRAM.
-- Test & Measurement World, 7/1/2009 8:43:00 AM
Verigy has introduced SmartRA (Scalable Memory Redundancy Technology), a memory redundancy analysis (RA) option for its V6000 WS test system. The scalable SmartRA allows manufacturers to meet the expanding fail-storage and performance requirements of redundancy analysis for DRAM. SmartRA will be showcased at the Semicon West trade show July 14 to 16, 2009 in San Francisco.
Verigy’s V6000 WS, introduced in November 2008, is a scalable, high-volume wafer-sort test system for both flash and DRAM applications. With SmartRA, V6000 WS users can add redundancy analysis capabilities for increased throughput and yield.
Verigy designed SmartRA to utilize high-performance blade servers, so manufacturers can add processing power for redundancy analysis as they need it, without impacting the test-cell footprint. SmartRA is based on an open software architecture which makes it possible for customers to use Verigy-provided algorithms or develop their own for faster time to market and lower cost-of-test.
“Unlike other testers that include the RA processing in the tester architecture, the V6000 with SmartRA doesn’t require users to spend more on replacing hardware to maintain throughput and yield,” said Gayn Erickson, vice president, memory test, Verigy. “SmartRA’s unique architecture and industry-leading throughput allow DRAM manufacturers to optimize their yield with scalable upgrades to provide the right performance at the lowest cost.”
No related content found.
- 0 rated items found.
Datasheets.com Electronic Parts & Inventory Search
185 million searchable parts
- Part Number
- Description
- Inventory
- Products
- Manufacturers
View All Webcasts
